Probing physical properties at the nanoscale

Brukman, Matthew J.; Bonnell, Dawn A.

doi:10.1063/1.2947647

Cited by 26 publications

(13 citation statements)

References 14 publications

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“…84 Several classes of properties are now probed at subnanometer resolution. In most cases, the properties are represented by single scalar numbers, such as resistance, conductance, potential, and work function.…”

Section: General Outlookmentioning

confidence: 99%

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

Bonnell¹,

Kalinin²,

Kholkin³

et al. 2009

MRS Bull.

195

133

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Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed. AbstractPiezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the electromechanical coupling effect in various materials systems. Here, we review recent progress in this field that demonstrates great potential of PFM for the investigation of static and dynamic properties of ferroelectric domains, nanofabrication and lithography, local functional control, and structural imaging in a variety of inorganic and organic materials, including piezoelectrics, semiconductors, polymers, biomolecules, and biological systems. Future pathways for PFM application in high-density data storage, nanofabrication, and spectroscopy are discussed.

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Section: General Outlookmentioning

confidence: 99%

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

Bonnell¹,

Kalinin²,

Kholkin³

et al. 2009

MRS Bull.

195

133

View full text Add to dashboard Cite

show abstract

“…Scanning spreading resistance microscopy (SSRM), scanning conductance Figure 8 illustrates an example in which spatial resolution of <1 nm was demonstrated on a HfO 2 thin film on silicon. 79 These and other similar results from semiconductor research indicate the potential for high spatial resolution in energy device materials as well.…”

Section: Probing Local Electrical Propertiesmentioning

confidence: 53%

Local Probes in the Next Decade of Energy Research: Bridging Macroscopic and Atomic Worlds

Bonnell

Kalinin

2013

Scanning Probe Microscopy for Energy Research

Self Cite

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The Energy ChallengeThe last 10 years have witnessed dramatic changes in global civilization, including the impact of technological innovation on the level and quality of life and rapidly expanding middle class populations in developing nations. While these changes yield a broad range of positive outcomes, they also lead to the challenge of meeting the increasing energy requirements of the global society in a sustainable and environmentally-responsible manner. Indeed, energy and consequences of energy usage is one of the most important, and perhaps the most important, challenge facing humanity.The magnitude of the challenge can be seen in the estimates of future energy requirements. The US Department of Energy predicts that global energy requirements will increase over the 2008 values by 50% by the year 2035, Fig. 1. 1 The supply of this amount of energy will require drastic changes in the major energy sources, and increased attention to the environmental impacts.

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“…The scan generation and image acquisition is performed by the easyLab SPM software and data acquisition card. 1 The analog feedback controller in Fig. 7 regulates the force and produces the topography signal.…”

Section: Data Acquisitionmentioning

confidence: 99%

“…These interactions include electrical and mechanical forces, chemical bonding, and biological processes [1][2][3][4][5]. Due to the unique imaging capabilities and wide range of use, there has been a dramatic increase in the number of imaging modes and sensors since the invention of the atomic force microscope (AFM) in 1986 [6].…”

Section: Introductionmentioning

confidence: 99%

Bridging the gap between conventional and video-speed scanning probe microscopes

2010

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Probing physical properties at the nanoscale

Abstract: With the interaction between a sharp tip and a surface tailored using combinations of static and time-dependent external fields, scanning probe techniques can image far more than topographic structure.

Cited by 26 publications

References 14 publications

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale

Local Probes in the Next Decade of Energy Research: Bridging Macroscopic and Atomic Worlds

Bridging the gap between conventional and video-speed scanning probe microscopes

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