Quantitative electrostatic force measurement in AFM

Jeffery, Steve; Oral, Ahmet; Pethica, J. B.

doi:10.1016/s0169-4332(99)00565-6

Cited by 17 publications

(13 citation statements)

References 7 publications

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“…Long-range forces can be electrostatic and van der Waals. Electrostatic forces are expected to be dependent on the square of the bias voltage between tip and sample, V 2 bias (Jeffery et al . 2000;Guggisberg et al .…”

Section: Atomic and Van Der Waals Force Gradientsmentioning

confidence: 99%

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Hoffmann

Oral

Grimble

et al. 2001

Proc. R. Soc. Lond. A

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Interatomic force gradients between a W tip and a 7 × 7 reconstructed Si(111) surface were measured using an off-resonance, ultra-low-amplitude atomic force microscope (AFM) technique. The amplitudes used were less than 1 Å (peak-to-peak), which allowed direct measurement of the interaction force gradients as a function of separation. The force gradient curves are shown to consist of an attractive van der Waals part and short-range attractive and repulsive interactions. The van der Waals background can be subtracted, leaving a short-range interaction with an energy parameter of 1.9-3.4 eV and an interaction length-scale of 0.54-1.26 Å, characteristic of a single atomic bond. This correlates well with our observation of single-atom resolved force gradient images. In general, the interaction is reversible up to the zero intercept of the force gradient (inflection point of the energy). Beyond this point hysteresis tends to be observed and the onset of inelastic deformation can be clearly discerned. An analysis of the atomic scale contact gives reasonable values for the interfacial energy, yield strength, and the energy per atom needed to initiate plastic deformation

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Section: Atomic and Van Der Waals Force Gradientsmentioning

confidence: 99%

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Hoffmann

Oral

Grimble

et al. 2001

Proc. R. Soc. Lond. A

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“…A number of attempts were performed in order to develop a suitable instrumental and procedural methodology allowing to calibrate the measurement setups and establish the description of specific properties of nanoworld basing on SI units system. As different properties of the surface can be measured with AFM, the variety of the approaches was observed regarding to specific measuring techniques: scanning thermal microscopy in terms of measuring local temperature as well as the thermal conductivity of the surface [9,10], scanning capacitance microscopy [11], conductive probe AFM [12], magnetic force microscopy [13], electrostatic force microscopy [14], Digital pulsed force imaging [15], Kelvin probe force microscopy [16]. So far however, as one of the first AFM measurement modes, the force spectroscopy is commonly applied in quantitative fashion, as a number of works provided reliable calibration solutions.…”

Section: Introductionmentioning

confidence: 99%

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Sikora¹

2016

NSNM

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Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface's properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.

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“…Among these methods are piezoacoustic, 1 magnetic, 2,3 photothermal, 4,5 and electrostatic excitation. [6][7][8][9] Piezoacoustic excitation is by far the most frequently used technique. In piezoacoustic excitation, a piezoelectric transducer is used to shake the AFM cantilever chip.…”

Section: Introductionmentioning

confidence: 99%

Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

Long

Cannara

2015

Review of Scientific Instruments

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Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response. To address these limitations, we developed a specialized AFM cantilever holder for electrostatic actuation of AFM cantilevers. The holder contains electrical contacts for the AFM cantilever chip, as well as an electrode (or electrodes) that may be precisely positioned with respect to the back of the cantilever. By controlling the voltages on the AFM cantilever and the actuation electrode(s), an electrostatic force is applied directly to the cantilever, providing a near-ideal transfer function from drive signal to tip motion. We demonstrate both static and dynamic actuations, achieved through the application of direct current and alternating current voltage schemes, respectively. As an example application, we explore contact resonance atomic force microscopy, which is a technique for measuring the mechanical properties of surfaces on the sub-micron length scale. Using multiple electrodes, we also show that the torsional resonances of the AFM cantilever may be excited electrostatically, opening the door for advanced dynamic lateral force measurements with improved accuracy and precision.

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Quantitative electrostatic force measurement in AFM

Cited by 17 publications

References 7 publications

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers

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