2001
DOI: 10.1109/23.983268
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Real-time flat-panel pixel imaging system and control for X-ray and neutron detection

Abstract: We present in this paper industrial nondestructive X-ray and neutron testing applications with a real-time digital imaging device and control system X-View based on active matrix flat-panel imager technology. X-View consists of X-ray or neutron converters, arrays of amorphous silicon (a-Si:H) thin-film transistors and photodiodes, a fast real-time electronic system for readout and digitization of images and appropriate computer tools for control, real-time image treatment data representation, and off-line anal… Show more

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Cited by 8 publications
(2 citation statements)
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“…See figure 10 0.7200 199.9 99.2745 6 detection, defined by the method through which their internal electric field is established; the merits and difficulties associated with each class are discussed below in the context of application. The charge-coupled device (CCD), although reported in the solid-state neutron detection literature [144,159,160] (not to be associated with scintillation-based CCD transduction [161,162]), is not included as its own class here due to its limitations in radiation hardness, temporal resolution and ability to detect over a continuous area [163]; however, some of the CCD limitations have recently been rectified with the charge injection device (CID) which may be worth further investigation [164]. For the detector class in which the internal electrical field is produced only by an external voltage (as shown schematically in figure 4(a)) the dielectric is a direct-conversion material that acts to both capture neutrons as well as transduce the primary capture reaction products.…”
Section: Norm (%)mentioning
confidence: 99%
“…See figure 10 0.7200 199.9 99.2745 6 detection, defined by the method through which their internal electric field is established; the merits and difficulties associated with each class are discussed below in the context of application. The charge-coupled device (CCD), although reported in the solid-state neutron detection literature [144,159,160] (not to be associated with scintillation-based CCD transduction [161,162]), is not included as its own class here due to its limitations in radiation hardness, temporal resolution and ability to detect over a continuous area [163]; however, some of the CCD limitations have recently been rectified with the charge injection device (CID) which may be worth further investigation [164]. For the detector class in which the internal electrical field is produced only by an external voltage (as shown schematically in figure 4(a)) the dielectric is a direct-conversion material that acts to both capture neutrons as well as transduce the primary capture reaction products.…”
Section: Norm (%)mentioning
confidence: 99%
“…The CMOS technology has been preferred to the more classical a-Si(H) technology [13][14][15] because it has the advantage to allow pixel size significantly smaller than 100 µm while keeping filling ratio as high as 80 % [16].…”
Section: Detector Hardwarementioning
confidence: 99%