1998
DOI: 10.1109/75.720461
|View full text |Cite
|
Sign up to set email alerts
|

Reducing the substrate losses of RF integrated inductors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
15
0
2

Year Published

2000
2000
2014
2014

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 44 publications
(17 citation statements)
references
References 6 publications
0
15
0
2
Order By: Relevance
“…For example, it is possible to transfer the role of silicon as the mechanical substrate carrier to a glued-on glass substrate, so that all silicon outside of the active device regions can be removed [34]. Local reduction of the silicon substrate losses can be achieved through an n-well formation [35], a lateral pn doping structure [36], a thick buried oxide layer [37], the formation of porous silicon [38], [39], or proton bombardment [40]. Near elimination of the substrate losses can be accomplished by local removal of the silicon [41]- [47] or by using high-aspect-ratio and surface micromachining techniques [48]- [51].…”
Section: Optimization Guidelinesmentioning
confidence: 99%
“…For example, it is possible to transfer the role of silicon as the mechanical substrate carrier to a glued-on glass substrate, so that all silicon outside of the active device regions can be removed [34]. Local reduction of the silicon substrate losses can be achieved through an n-well formation [35], a lateral pn doping structure [36], a thick buried oxide layer [37], the formation of porous silicon [38], [39], or proton bombardment [40]. Near elimination of the substrate losses can be accomplished by local removal of the silicon [41]- [47] or by using high-aspect-ratio and surface micromachining techniques [48]- [51].…”
Section: Optimization Guidelinesmentioning
confidence: 99%
“…In the example of Fig. 3(a) [5], this is accomplished by inserting narrow stripes of n + regions perpendicular to the current flow such as to create blocking p-n-p junctions. This blocking structure resulted in a Q improvement from 5.3 to 6.0 (13.2%) at 3.5 GHz on a 1.8nH inductor, obtaining an inductance-per-turn of 0.9nH.…”
Section: Conventional Rfic Inductorsmentioning
confidence: 99%
“…In addition to being frequently employed in passive tuning circuits, or as high-impedance chokes, many novel techniques to achieve low-voltage operation in advanced silicon IC processes rely on the negligible DC voltage drop across inductors when utilized as loads or as emitter/source degenerators [3][4]. When fabricated in a planar process, the trace capacitance to ground tends to lower the inductor selfresonance frequency, and the substrate conductivity tends to lower its quality factor (Q) [5]. While optimization of the spiral geometry and line width [2], [5][6] is essential to tailor the frequency of maximum Q, this exercise only addresses minimization of the trace ohmic losses and substrate capacitance.…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations