2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe) 2017
DOI: 10.23919/epe17ecceeurope.2017.8098962
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Reduction of parasitic capacitance in 10 kV SiC MOSFET power modules using 3D FEM

Abstract: Support has been received from the IEPE and APETT projects funded by Innovation Fund Denmark and the MV platform project funded by the Obel Family Foundation.

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Cited by 41 publications
(34 citation statements)
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“…This model is denoted as a Level 1 model, and self-inductance calculated for each trace is shown in Table II. A reported issue of this is that the summation of the inductances becomes large, because when evaluating each inductance individually, no mutual inductance effects are included in the model [42]. Thus, often an approach is used at which the full loop is evaluated [30], [43], [44]. In this approach, each device is modeled as a conductor, i.e., the drain and source of a switch are electrically shorted.…”
Section: Electrical Simulation Modelmentioning
confidence: 99%
“…This model is denoted as a Level 1 model, and self-inductance calculated for each trace is shown in Table II. A reported issue of this is that the summation of the inductances becomes large, because when evaluating each inductance individually, no mutual inductance effects are included in the model [42]. Thus, often an approach is used at which the full loop is evaluated [30], [43], [44]. In this approach, each device is modeled as a conductor, i.e., the drain and source of a switch are electrically shorted.…”
Section: Electrical Simulation Modelmentioning
confidence: 99%
“…One such module with external SiC JBS diodes is presented in Fig. 7 along with the schematic displaying the power module parasitics extracted form ANSYS Q3D [4]. The shown power module is packaged in-house at Aalborg University and populated with two generation 1 10 kV/10 A SiC MOSFET and 10 kV SiC JBS diode dies from Wolfspeed.…”
Section: Device Under Testmentioning
confidence: 99%
“…With latest technological improvements these devices are reaching the level of maturity to be considered for medium voltage and high power conversion applications e.g., solid state transformer [2]. Considering high dv/dt switching transients, intrinsic device parasitics together with parasitic capacitance external to the device are crucial and require careful optimization to utilize SiC MOSFETs at their full potential [3], [4]. In a half bridge power module, the mid-point experiences high dv/dt during switching transients.…”
Section: Introductionmentioning
confidence: 99%
“…The voltage balancing across the series-connected devices is mainly caused by the tolerance in device parameters, package/layout parasitic components, and gate signal timing delays [7][8][9]. Careful selection of power semiconductor devices, which have parameters with low spread and synchronizing gate-drive signals, are helpful in reducing voltages unbalance across the power devices.…”
Section: Introductionmentioning
confidence: 99%
“…Careful selection of power semiconductor devices, which have parameters with low spread and synchronizing gate-drive signals, are helpful in reducing voltages unbalance across the power devices. In addition to this, snubber circuits, active gate drive circuits, voltage clamping techniques [7][8][9][10][11], and new concepts of packaging as described in [12,13] have also been reported as interesting contributions in an attempt to reduce or even remove the voltage unbalance among the series-connected power devices.…”
Section: Introductionmentioning
confidence: 99%