Conductive Atomic Force Microscopy 2017
DOI: 10.1002/9783527699773.ch14
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KPFM and its Use to Characterize the CPD in Different Materials

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Cited by 8 publications
(4 citation statements)
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“…In the following, the work function (WF) of ITO with the 2D TiS 2 film was determined by a Kelvin probe force microscope (KPFM) using highly oriented pyrolytic graphite (HOPG) as a reference and the measurement method referred in the literature. 42 As shown in Figure 2, the WF of pristine ITO was 4.75 eV, which is consistent with that reported in the literature. 43 Upon modification with 2D TiS 2 , the WF increased to 4.79 eV.…”
Section: Resultssupporting
confidence: 91%
“…In the following, the work function (WF) of ITO with the 2D TiS 2 film was determined by a Kelvin probe force microscope (KPFM) using highly oriented pyrolytic graphite (HOPG) as a reference and the measurement method referred in the literature. 42 As shown in Figure 2, the WF of pristine ITO was 4.75 eV, which is consistent with that reported in the literature. 43 Upon modification with 2D TiS 2 , the WF increased to 4.79 eV.…”
Section: Resultssupporting
confidence: 91%
“…In addition, the results of the KPFM test (Figure 3b, e) mentioned in the previous section shows that the average value of the surface potential of the perovskite film increased from 0.47 to 0.71 V. In the KPFM test, the potential of the film surface and the work function of the sample have the following relationship: Vcpdbadbreak=ϕtipϕsamplee\[ \begin{array}{*{20}{c}}{{V_{{\rm{cpd}}}} = \frac{{{\phi _{{\rm{tip}}}} - {\phi _{{\rm{sample}}}}}}{{ - e}}}\end{array} \] where V cpd refers to the potential of the film surface, ϕ tip is the work function of the tip, and ϕ sample represents the work function of the sample, and e is the elementary charge. [ 52 ] Therefore, this result also manifests the enhancement of the surface work function of the film, which is consistent with the UPS results.…”
Section: Resultssupporting
confidence: 89%
“…where V cpd refers to the potential of the film surface, φ tip is the work function of the tip, and φ sample represents the work function of the sample, and e is the elementary charge. [52] Therefore, this result also manifests the enhancement of the surface work function of the film, which is consistent with the UPS results. Due to the presence of quaternary ammonium salt groups and conjugated benzene rings on the polymer, it is speculated that the increase in the work function and the valence band is probably due to the formation of interface dipoles which led to an increase in the vacuum energy level and an upward bending of the valence band.…”
Section: Dipole Arrangement and Charge Dynamics In The 3d/aip Heteroj...supporting
confidence: 89%
“…Atomic force microscopy (AFM) is an alternative to probing the photoreaction at the surface. In particular, Kelvin probe force microscopy (KPFM), one of the AFM extensions, can measure surface potential distribution recorded as contact potential difference (CPD). , Yun et al revealed that the grain boundaries act as a pathway for the migration of both photogenerated carriers and ions by monitoring the Coulombic interaction between the KPFM tip and the surface charges of the perovskite solar cell . Ma et al conducted the KPFM and conductive AFM for local observation of both surface Fermi level and photocurrent in MAPbI 3 as a function of temperature to investigate the effect of temperature-induced phase transition on the electrical properties of MAPbI 3 .…”
Section: Introductionmentioning
confidence: 99%