1996
DOI: 10.1016/0022-0248(95)00566-8
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SiC liquid-phase epitaxy on patterned substrates

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Cited by 15 publications
(9 citation statements)
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“…Typical values of this ∥/⊥ anisotropy calculated in this work are very small, below 3 in the 1400–1450 °C range and close to 0 at lower temperature (see Table ). If we now compare these values with the ones that can be found in the literature for the epitaxial growth of SiC, one can see that it is similar with the case of SiC growth from the melt using pure Si where values close to 1 are found . But when CVD technique is used, the typical values of ∥/⊥ anisotropy are in the 10 2 –10 3 range at 1600 °C .…”
Section: Discussionsupporting
confidence: 75%
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“…Typical values of this ∥/⊥ anisotropy calculated in this work are very small, below 3 in the 1400–1450 °C range and close to 0 at lower temperature (see Table ). If we now compare these values with the ones that can be found in the literature for the epitaxial growth of SiC, one can see that it is similar with the case of SiC growth from the melt using pure Si where values close to 1 are found . But when CVD technique is used, the typical values of ∥/⊥ anisotropy are in the 10 2 –10 3 range at 1600 °C .…”
Section: Discussionsupporting
confidence: 75%
“…If we now compare these values with the ones that can be found in the literature for the epitaxial growth of SiC, one can see that it is similar with the case of SiC growth from the melt using pure Si where values close to 1 are found. 6 But when CVD technique is used, the typical values of ) / ^anisotropy are in the 10 2 À10 3 range at 1600 °C. 2 This is because of the very high lateral growth rates (>400 μm/h).…”
Section: Discussionmentioning
confidence: 99%
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“…On the other hand, the free-spreading growth may start from multiple nucleation. With time, the crystallites would come in contact and merge together along the <112 ¯0> directions of the highest growth rate 27 to form defective boundaries inside the n and l facets.…”
Section: Discussionmentioning
confidence: 99%
“…Si, Si:Cr or Si:Sc as solvent for the solute C. 15,16 Si:Sc was preferably used by Yakimova et al 17 However, this alloy seems to be problematic as it forms various solid solutions. The most promising solvents/solvent components for lowtemperature LPE include Ga, Sn, Ni, Cu, Al, Cr and Co. [18][19][20][21] The purpose of the metal component is to increase the solubility of the carbon, thereby facilitating faster growth rates, thicker SiC layers and lower growth temperatures. However, the metal is incorporated into the SiC layer to some extent, thereby forming unwanted metal carbides/metal silicides.…”
Section: Introductionmentioning
confidence: 99%