2021
DOI: 10.1063/5.0040733
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Silicon cantilevers locally heated from 300 K up to the melting point: Temperature profile measurement from their resonances frequency shift

Abstract: When heated, micro-resonators present a shift of their resonance frequencies. We study specifically silicon cantilevers heated locally by laser absorption and evaluate theoretically and experimentally their temperature profile and its interplay with the mechanical resonances. We present an enhanced version of our earlier model [Sandoval et al., J. Appl. Phys. 117, 234503 (2015)], including both elasticity and geometry temperature dependency, showing that the latter can account for 20% of the observed shift for… Show more

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Cited by 10 publications
(21 citation statements)
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“…When heated, the cantilever mechanical resonance frequencies shift owing to a change in the stiffness due to the temperature dependency of Young's modulus and thermal expansion. Knowing the thermo-mechanical properties of silicon, the cantilever temperature can be deduced by tracking the frequency shift [17]. The experimental setup uses a single laser beam (Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…When heated, the cantilever mechanical resonance frequencies shift owing to a change in the stiffness due to the temperature dependency of Young's modulus and thermal expansion. Knowing the thermo-mechanical properties of silicon, the cantilever temperature can be deduced by tracking the frequency shift [17]. The experimental setup uses a single laser beam (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…At high P 0 , corresponding to high temperatures, the silicon extinction coefficient κ is large enough to kill the interferences, the cantilever becomes non-transparent. The temperature elevation deduced from the frequency shift [17] measured for the first two mechanical modes is displayed in Fig. 8-b.…”
Section: Resultsmentioning
confidence: 99%
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