2016
DOI: 10.1088/1674-4926/37/3/034003
|View full text |Cite
|
Sign up to set email alerts
|

Small-signal model parameter extraction for AlGaN/GaN HEMT

Abstract: A new 22-element small signal equivalent circuit model for the AlGaN/GaN high electron mobility transistor (HEMT) is presented. Compared with the traditional equivalent circuit model, the gate forward and breakdown conductions (Ggsf and Ggdf) are introduced into the new model to characterize the gate leakage current. Additionally, for the new gate-connected field plate and the source-connected field plate of the device, an improved method for extracting the parasitic capacitances is proposed, which can be appl… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
8
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 13 publications
(8 citation statements)
references
References 10 publications
0
8
0
Order By: Relevance
“…Figure 4d illustrates the occurrence of the aforementioned scenario through the changes in the band structures between the bilayer dielectrics under different V CB biases. We also constructed an equivalent circuit model (shown in Supporting Information Figure S11b) to figure out the influence of the extrinsic 46 and intrinsic 47 parts by using the Advanced Design System software. The simulated results fitted well with experimental data before and after the de-embedding process, as shown in Supporting Information Figure S11.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 4d illustrates the occurrence of the aforementioned scenario through the changes in the band structures between the bilayer dielectrics under different V CB biases. We also constructed an equivalent circuit model (shown in Supporting Information Figure S11b) to figure out the influence of the extrinsic 46 and intrinsic 47 parts by using the Advanced Design System software. The simulated results fitted well with experimental data before and after the de-embedding process, as shown in Supporting Information Figure S11.…”
Section: Resultsmentioning
confidence: 99%
“…Extrinsic pad capacitances (C pg , C pgd , C pd ) of the device is mostly extracted from the cold‐FET method . When V ds =0 V and V gs is less than the negative pinch‐off voltage, the channel conductivity is insignificant and simulated S‐parameters of the passive device shows capacitive behavior . In this case, the intrinsic gate‐source and gate‐drain capacitances are equal but the extrinsic pad capacitances are not equal although their difference can be negligible.…”
Section: Equivalent Circuit Model Parameters Extractionmentioning
confidence: 99%
“…In this case, the intrinsic gate‐source and gate‐drain capacitances are equal but the extrinsic pad capacitances are not equal although their difference can be negligible. The resistances and inductances can be neglected due to negligible conductance and intrinsic gate capacitance upto few gigahertz frequencies . The three pad capacitances C pg , C pd , and C pgd can be calculated from slope of the imaginary parts of the Y‐parameters Y 11 , Y 22 , and Y 12 =Y 21 , respectively as shown in Figure .…”
Section: Equivalent Circuit Model Parameters Extractionmentioning
confidence: 99%
See 2 more Smart Citations