Some applications of SIMS in conservation science, archaeometry and cosmochemistry

McPhail, David S.

doi:10.1016/j.apsusc.2006.02.132

Cited by 25 publications

(12 citation statements)

References 5 publications

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“…ToF-SIMS is a surface-sensitive analytical tool that provides information on the uppermost few molecular layers. ToF-SIMS has been previously used in materials science, [ 26 , 27 ] semiconductor industry, [ 28 , 29 ] geology, [ 30 ] archaeometry, [ 31 ] cosmochemistry, [ 32 ] and biology. [ 33 , 34 ] The mass imaging capability of ToF-SIMS combines the potential benefi ts of chemical imaging and mass spectroscopy.…”

Section: Immobilization Of Biomoleculesmentioning

confidence: 99%

A Generic Strategy for Co‐Presentation of Heparin‐Binding Growth Factors Based on CVD Polymerization

Deng

Lahann

2012

Macromol. Rapid Commun.

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A multifunctional copolymer with both aldehyde and alkyne groups is synthesized by chemical vapor deposition (CVD) for orthogonal co-immobilization of biomolecules. Surface analytical methods including FTIR and XPS are used to confirm the surface modification. Heparin-binding growth factors [basic fibroblast growth factor (bFGF) in this study] can be immobilized through interaction with heparin, which was covalently attached to the CVD surface through an aldehyde-hydrazide reaction. In parallel, an alkyne-azide reaction is used to orthogonally co-immobilize an adhesion peptide as the second biomolecule.

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Section: Immobilization Of Biomoleculesmentioning

confidence: 99%

A Generic Strategy for Co‐Presentation of Heparin‐Binding Growth Factors Based on CVD Polymerization

Deng

Lahann

2012

Macromol. Rapid Commun.

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“…Secondary ion mass spectrometry (SIMS) is a destructive analysis technique that has already been used to determine the elemental composition of museum artifacts [14][15][16][17][18]. SIMS is an ultra-high vacuum technique and the quality of data depends on the quality of vacuum over the sample.…”

Section: Fib-sims Analysismentioning

confidence: 99%

Laser Cleaning of Excavated Greco-Roman Glass: Removal of Burial Encrustation and Corrosion Products

Elnaggar¹,

Mohamed²,

Mahgoub³

et al. 2010

Studies in Conservation

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The potential of using laser-assisted cleaning for the removal of burial encrustation and corrosion products on Egyptian glass fragments (from between 332 bce and 395 ce) excavated from Sinai (Egypt) using a 10 nanosecond Q-switched Nd:YAG laser operating at 1064 nm has been assessed. A series of complementary analytical techniques including microscopy, Fourier transform infrared spectroscopy, static secondary ion mass spectrometry with a focused ion beam and scanning electron microscopy coupled with an energy-dispersive X-ray spectrometer were employed to characterize the glass deterioration phenomena. Following the optimization of laser cleaning parameters, results suggest that laser cleaning successfully removes both the burial encrustation and degradation products, without damage to the underlying glass substrate.ÖZET Mısır Sinai'deki kazılarda bulunan antik cam parçaları üzerindeki korozyon ve gömü ortamı yüzünden oluşan kabuklanmaları temizlemek için lazer yöntemi (10 nanosaniye, Q-switched Nd:YAG lazer, 1064 nm) denenmiştir. Camın bozulma sebeplerini tanımlamak için, bir çok analitik teknik (mikroskopi, Fourier-Dönüşümlü Kızıl Ötesi Spektroskopi, Odaklanmış iyon ışınlı statik ikincil iyon kütle spektrometresi, ve enerji dağıtıcı X-ray spektrometresi ile birleştirilmiş tarama elektron mikroskobu) kullanılmıştır. Lazerle temizleme parametrelerinin uygunlaştırma yöntemlerini takiben alınan sonuçlar lazer tekniğinin, gömü ortamı sebebiyle oluşan kabuklanmayı ve bozulmayı, camın kendisine zarar vermeden başarılı bir şekilde temizlediğini kanıtlamıştır.

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“…Indeed, the first analytical results using FIB tomography were achieved using the FEI FIB/SIMS instrumentation with SIMS maps (and ion‐induced secondary electron images) acquired on sequential FIB milled slices of material 8. McPhail et al continue to publish work using the SIMSMAP III on scientifically relevant problems 9, 10. In addition, Stevie et al showed that the detection limit < 0.1 at.% was possible for Al, Cr, Li and K in Si, and 20 ppm for Na in Si, all without the aid of secondary ion‐enhancing species using this experimental setup 11…”

Section: Introductionmentioning

confidence: 99%

A review of Ga⁺ FIB/SIMS

Giannuzzi¹,

Utlaut

2011

Surface & Interface Analysis

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FIB/SIMS analyses has been performed and reported for well over a decade, however, only within limited research groups due to the lack of commercial FIB/SIMS instrumentation. Commercial availability of FIB/SIMS failed mainly due to two reasons: (i) the low secondary ion yields from the primary Ga + source; and (ii) unrealistic expectations in sensitivity detection limits using the small FIB source. Despite the low yields and limits in sensitivity detection limited by the small volume of material analyzed, FIB/SIMS is extremely useful for conventional ppm SIMS analysis as well as high-spatial resolution analyses.

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Some applications of SIMS in conservation science, archaeometry and cosmochemistry

Cited by 25 publications

References 5 publications

A Generic Strategy for Co‐Presentation of Heparin‐Binding Growth Factors Based on CVD Polymerization

A Generic Strategy for Co‐Presentation of Heparin‐Binding Growth Factors Based on CVD Polymerization

Laser Cleaning of Excavated Greco-Roman Glass: Removal of Burial Encrustation and Corrosion Products

A review of Ga⁺ FIB/SIMS

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Some applications of SIMS in conservation science, archaeometry and cosmochemistry

Cited by 25 publications

References 5 publications

A Generic Strategy for Co‐Presentation of Heparin‐Binding Growth Factors Based on CVD Polymerization

A Generic Strategy for Co‐Presentation of Heparin‐Binding Growth Factors Based on CVD Polymerization

Laser Cleaning of Excavated Greco-Roman Glass: Removal of Burial Encrustation and Corrosion Products

A review of Ga+ FIB/SIMS

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A review of Ga⁺ FIB/SIMS