Polarization-resolved four-wave mixing spectroscopy is used to study interwell carrier dynamics in an alternating-strain multiquantum-well optical amplifier. The experimental data are found to be in good agreement with a simple model based on quantum capture/escape and diffusion processes. The results suggest that the interwell transport in this structure is mainly limited by carrier escape, and give an estimate of 16 ps for the overall transport lifetime. © 1996 American Institute of Physics.
͓S0003-6951͑96͒04753-5͔Interwell carrier transport in semiconductor multiquantum-well structures is a highly nonlinear process with significant implications to the use of these structures in electrical and optical devices. Of particular interest is the finite rate at which the carrier densities in neighboring wells reach equilibrium with one another and with the distribution of unconfined carriers in the barrier region. This process has received considerable attention in recent years 1-8 since it has been associated with nonlinear gain compression, and hence the maximum modulation bandwidth of quantum-well lasers.In this letter, we report on a simple experiment aimed at measuring the rate at which modulated carrier distributions are transferred between neighboring quantum wells. This measurement is based on polarization-resolved four-wave mixing ͑FWM͒ spectroscopy in an InGaAsP alternatingstrain semiconductor optical amplifier ͑SOA͒, consisting of three pairs of tensile and compressively strained quantum wells.9 In a recent article 7 it was shown how this technique enables selective excitation and probing of adjacent quantum wells, and the effect of interwell transport was qualitatively observed. Here we apply the results of a subsequent detailed study of the polarization properties of FWM 10 to also obtain quantitative information. In particular, a fit of the experimental data to a simple model gives an estimated 16 ps for the interwell transport lifetime in the structure measured.