2009
DOI: 10.1016/j.scriptamat.2009.06.025
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Sub-micrometer synchrotron tomography of multiphase metals using Kirkpatrick–Baez optics

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Cited by 69 publications
(33 citation statements)
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“…76 Harder X-rays are particularly well suited to the study of metals and matrix composites. Requena et al used 17?5 keV for Al-based systems and 29 keV for Ti systems 77 at around 100 nm. Electron microscope optics: Horn and Waltinger 78 were perhaps the first to realise that a SEM could be used for X-ray projection microscopy exploiting the highly focussed spot formed by the electron beam.…”
Section: Very High Resolution Imagingmentioning
confidence: 99%
“…76 Harder X-rays are particularly well suited to the study of metals and matrix composites. Requena et al used 17?5 keV for Al-based systems and 29 keV for Ti systems 77 at around 100 nm. Electron microscope optics: Horn and Waltinger 78 were perhaps the first to realise that a SEM could be used for X-ray projection microscopy exploiting the highly focussed spot formed by the electron beam.…”
Section: Very High Resolution Imagingmentioning
confidence: 99%
“…In projection mode at 17-29 keV, with inherent propagation-based phase contrast, a spatial resolution of 180 nm in 3D has been reported in Requena et al (2009). In full-field mode and Zernike phase contrast a spatial resolution of 30 nm was demonstrated for the 2D case in Chen et al (2011) and beyond 200 nm for 3D in and Takeuchi et al (2011).…”
Section: Introductionmentioning
confidence: 95%
“…Microtomography excels today with its fast [17][18][19] and high-resolution [20,21] versions. Tomographic studies of void growth have already been performed during uniaxial deformation at room temperature on a dual-phase steel [19] and a model composite [22].…”
Section: Introductionmentioning
confidence: 99%