2012
DOI: 10.1364/ao.51.003526
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Subwavelength resist patterning using interference exposure with a deep ultraviolet grating mask: Bragg angle incidence versus normal incidence

Abstract: Interference lithography using a deep-ultraviolet (DUV) laser is instrumental in the manufacture of subwavelength patterns used at visible wavelengths. We investigated a grating mask strategy for exposure in terms of how to set and illuminate masks. To obtain high aspect ratio patterns, high fringe visibility, and high exposure uniformity are essential, and for that purpose the use of only two beams with liquid immersion is necessary but not sufficient. It needs to be addressed whether the grating should face … Show more

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Cited by 9 publications
(3 citation statements)
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“…Static NFH setup Fig. 2 shows a conventional NFH setup denoted as the static NFH (SNFH) (Amako & Sawaki, 2012;Li et al, 2016). The unstructured surface of the phase mask faces the photoresist layer on a fused silica grating substrate (refractive index n = 1.482-325 nm).…”
Section: Specifications Of a Soft X-ray Vlsgmentioning
confidence: 99%
“…Static NFH setup Fig. 2 shows a conventional NFH setup denoted as the static NFH (SNFH) (Amako & Sawaki, 2012;Li et al, 2016). The unstructured surface of the phase mask faces the photoresist layer on a fused silica grating substrate (refractive index n = 1.482-325 nm).…”
Section: Specifications Of a Soft X-ray Vlsgmentioning
confidence: 99%
“…The half pitch resolution of conventional interference lithography, however, is theoretically limited by one quarter of light wavelength. For the improvement of resolution, light sources with shorter wavelength have been demonstrated, such as deep ultraviolet (DUV) 5 , extreme ultraviolet (EUV) 6 7 , and soft X-ray 8 . Unfortunately, the expensive laser setups and complex processing impede their practical applications.…”
mentioning
confidence: 99%
“…Hence, suppressing interface reflections is a promising approach to improving the quality of resist patterns. Recently, Amako et al [18] have successfully reduced interface reflections by filling the gap between the mask and the resist with a refractive index liquid. However, refractive index liquids need time to become uniform and they risk contamination, which renders NFH complicated.…”
mentioning
confidence: 99%