Supply current test for unit-to-unit variations of electrical characteristics in gates

Hashizume, Masaki; Kuchii, Toshimasa; Tamesada, Takeomi

doi:10.1109/ats.1997.643985

Cited by 3 publications

(4 citation statements)

References 8 publications

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“…(6) where I iL and I iH are quiescent supply currents of i-th bipolar gate when the output logic value is L and when it is H, respectively.…”

Section: Supply Current Test Methods For Bipolar Logic Circuitmentioning

confidence: 99%

“…In the past, we proposed a random test generation algorithm [4] and a deterministic one [5] for the supply current tests. In our experiments, test input vectors are derived by a modified random test input generation method, which is almost the same as in [6].…”

Section: Testability Analysismentioning

confidence: 99%

“…Thus, we proposed a test method which is applicable even if there are some variations among gates [6]. In the past, we examined practical fault coverage of the supply current test method for open faults in TTL combinational circuits made of TTL LS-type SSIs on printed-circuit-board, since open faults often occur in logic circuits fabricated with the state-of-art technology [7].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Practical Fault Coverage of Supply Current Tests for Bipolar ICs

Tsukimoto

Hashizume

Yotsuyanagi

et al.

Second IEEE International Workshop on Electronic Design, Test and Applications

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Bipolar logic circuits are indispensable for implementing high-speed logic circuits. Since quiescent supply current flows into the circuits without faults, they can not be tested by a conventional IDDQ test method. We proposed a quiescent supply current test method which is applicable for the bipolar circuit tests, and examined the testability of open faults under an ideal assumption that there are not any process variations. Actually, there are some variations in the quiescent supply current of each gate in implemented logic circuits. Thus, It is necessary to examine the practical testability of the test method before applying to production tests of bipolar logic ICs. In this paper, the practical testability obtained under an assumption that there are some unitto-unit variations of supply current among gates is examined for ISCAS-85 benchmark circuits. The experimental results show that larger fault coverage can be obtained with a smaller number of test input vectors by our supply current test method than the functional test one based on stuck-at fault models.

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“…(6) where I iL and I iH are quiescent supply currents of i-th bipolar gate when the output logic value is L and when it is H, respectively.…”

Section: Supply Current Test Methods For Bipolar Logic Circuitmentioning

confidence: 99%

Section: Testability Analysismentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Practical Fault Coverage of Supply Current Tests for Bipolar ICs

Tsukimoto

Hashizume

Yotsuyanagi

et al.

Second IEEE International Workshop on Electronic Design, Test and Applications

Self Cite

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show abstract

“…Characteristic parameters are derived from the circuit files by SPICE simulation and the mean value and the variance are calculated for each inserted bridging fault. In our experiments, it is determined whether the fault can be detected with the specified level of significance(a) like in [16,17]. Since usually, either 0.1 or 0.01 is used as a, they are used in our experiments.…”

Section: Testability Of Our Iddq Test For Process Variationmentioning

confidence: 99%