2012
DOI: 10.1016/j.colsurfa.2012.04.042
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TDNMR characterization of a model crystallizing surfactant system

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Cited by 4 publications
(7 citation statements)
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“…The microstructural change was characterized by X-ray scattering, DSC and PLM. We further support our experimental observations with composition calculations derived from recent TDNMR measurements of crystal content of formulations containing 12 wt% surfactant with different amounts of palmitic acid [19].…”
Section: Resultssupporting
confidence: 88%
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“…The microstructural change was characterized by X-ray scattering, DSC and PLM. We further support our experimental observations with composition calculations derived from recent TDNMR measurements of crystal content of formulations containing 12 wt% surfactant with different amounts of palmitic acid [19].…”
Section: Resultssupporting
confidence: 88%
“…DSC measurements on crystals separated from the formulation confirmed that the crystals are comprised of palmitic acid [18]. Recent TDNMR measurements led to the hypothesis that these palmitic acid crystals are surrounded by adsorbed layers of hydrated surfactants [19]. X-ray scattering, DSC and polarized light microscopy (PLM) also confirmed the presence of a surfactant-palmitic acid mixed lamellar mesophase in conjunction with crystals [18].…”
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confidence: 85%
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