Texture Evolution in Thin Films

Suwas, Satyam; Ray, R.K.

doi:10.1007/978-1-4471-6314-5_7

Cited by 3 publications

(2 citation statements)

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“…Texture, which describes the statistical distribution of grain orientations, is an important microstructural characteristic of thin films, as it can strongly influence the various functional properties [1][2][3][4][5][6][7][8][9][10]. Four types of texture component have been identified in thin films: random texture, in which the orientations of grains are fully random (no preferred growth orientation); fiber texture [1,11,12], where the orientation of a lattice plane is preferentially parallel to the substrate plane, while there is some rotational degree of freedom around the axis perpendicular to the substrate plane; in-plane texture (epitaxy), in which all three axes of the grains in thin film are aligned and fixed by the crystallographic orientations of single crystal substrates [1,11,13,14];…”

Section: Introductionmentioning

confidence: 99%

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Growth, interfacial microstructure and optical properties of NiO thin films with various types of texture

et al. 2019

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NiO thin films with random, fiber and in-plane textures have been successfully deposited at near room temperature by reactive magnetron sputtering on glass, silicon and Al 2 O 3 (0001) substrates. Self-texture related with the deposition conditions and crystallographic characters competes with the driving force from the matched substrate. Such a competition can be used to control the texture of thin films on matched substrates, especially when the promoting orientations from self-texture and substrate are different. Enhancing this competition tends to suppress the selftexture of NiO thin films on Al 2 O 3 (0001) substrates, whereas restricting the competition is beneficial to produce the in-plane textured NiO thin films. In addition, it is found that the optical transmittance of NiO thin films on Al 2 O 3 (0001) substrates can also be tuned by such competition. Interfacial microstructure analyses of NiO thin films on amorphous substrates clearly evidence the existence a nanocomposite layer at the initial growth, which is composed of NiO nanocrystals surrounded by amorphous matrix. In contrast, in-plane textured NiO thin films on Al 2 O 3 (0001) substrates exhibit sharp interface without nanocrystals or amorphous matrix. We believe these results provide a general framework of tuning the textures and properties of thin films on matched substrates.

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Section: Introductionmentioning

confidence: 99%

“…off-normal fiber-like texture (axiotaxy), where the preferred alignment of planes across the interface manifests itself as a fiber texture lying off-normal to the sample surface, with the fiber axis perpendicular to certain planes in the substrate [1,11].…”

Section: Introductionmentioning

confidence: 99%