1998
DOI: 10.1143/jjap.37.4433
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The Electronic Behaviors of Oxygen-Deficient VO2 Thin Films in Low Temperature Region

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Cited by 11 publications
(9 citation statements)
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“…The transport characteristics of transition metal oxides are sensitive to redox reactions because the valence numbers of the transition metal ions are easily changed by the reactions, which affect the carrier density and/or stabilization of the crystal structure1234. Of the prototypical materials, VO 2 is promising as it undergoes a metal-insulator transition (MIT) and the resistance changes by orders of magnitude around 340 K. In VO 2 nano to microstructures5678910111213, the coupling of the MIT with mechanical789, optical13, thermal12 and electronic properties911 can be used in tunable resonators, optical switchers, electronic and thermo-sensing devices.…”
mentioning
confidence: 99%
“…The transport characteristics of transition metal oxides are sensitive to redox reactions because the valence numbers of the transition metal ions are easily changed by the reactions, which affect the carrier density and/or stabilization of the crystal structure1234. Of the prototypical materials, VO 2 is promising as it undergoes a metal-insulator transition (MIT) and the resistance changes by orders of magnitude around 340 K. In VO 2 nano to microstructures5678910111213, the coupling of the MIT with mechanical789, optical13, thermal12 and electronic properties911 can be used in tunable resonators, optical switchers, electronic and thermo-sensing devices.…”
mentioning
confidence: 99%
“…25 However, our temperature dependence is comparable to that observed by Wu et al 19 in both suspended and clamped devices that were also fabricated by mechanical transfer from the growth substrate to the device substrate. VO 2 thin films have shown an activated resistivity with an activation energy that is dependent on O 2 partial pressure during growth, 36,37 suggesting that oxygen vacancies and/or vanadium interstitials may influence the transport. The room temperature resistivity of our nanobeams is an order of magnitude lower than that of Wei et al, 25 consistent with the presence of carriers provided by these defects.…”
mentioning
confidence: 99%
“…Actually, a large amount of vacancies can be generated during the e-beam irradiation. Some deep levels or midgaps formed by oxygen vacancies or disorder effects may play an important role in increasing the conductivity . The variation of current density with the e-beam irradiation is plotted after the electrical properties of several nanowires are measured in Figure b.…”
Section: Resultsmentioning
confidence: 99%