“…In the AES measurements on 4-5 nm thick PTCDA films the C (275 eV) and O (510 eV) peaks were registered. In the AES measurements on 4-5 nm thick CuPc films, the C (275 eV), N (389 eV) and Cu (922, 842 and 778 eV) were measured and the relative intensities, considering the AES sensitivity factors [30], were in agreement with atomic composition of these molecules [20][21][22]. Besides these peaks, the O (510 eV) peak was clearly observed in the case of CuPc films.…”