Three-Dimensional Electric Field Probing of Ferroelectrics on the Nanometer Scale Using Scanning Force Microscopy

Eng, Lukas M.; Grafström, S.; Loppacher, Christian; Schlaphof, F.; Trogisch, S.; Roelofs, Andreas; Waser, Rainer

doi:10.1007/3-540-44946-9_24

Cited by 28 publications

(20 citation statements)

References 22 publications

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“…Due to the sample surface roughness and the slight variation in chemical compositions, the effective PFM tip‐sample contact area varies along the sample surface. As a result, the electric field imposed by PFM tip is inhomogeneous . In contrast, the P – E hysteresis loop gathered information from a large number of grains under the electrode area, thus the applied electric field on the sample surface would be much more uniform.…”

Section: Resultsmentioning

confidence: 99%

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO₃‐based Thin Films

et al. 2013

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Orientation-engineered (La, Ce) cosubstituted 0.94(Bi 0.5 Na 0.5 ) TiO 3 -0.06BaTiO 3 thin films were epitaxially deposited on CaRuO 3 buffered (LaAlO 3 ) 0.3 (Sr 2 AlTaO 6 ) 0.35 single-crystal substrates by pulsed laser deposition. The ferroelectric, piezoelectric, dielectric, and leakage current characteristics of the thin films were significantly affected by the crystallographic orientation. We found that the (001)-oriented film exhibited the best ferroelectric properties with remnant polarization P r = 29.5 lC/cm 2 and coercive field E c = 7.4 kV/mm, whereas the (111)-oriented film demonstrated the largest piezoelectric response and dielectric permittivity. The bipolar resistive switching behavior, which is predominantly attributed to a combined effect of ferroelectric switching and formation/rupture of conductive filaments, was observed. The conduction mechanisms were determined to be ohmic conduction and Poole-Frenkel emission at high-and low-resistance states, respectively, in all the films. †

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Section: Resultsmentioning

confidence: 99%

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO₃‐based Thin Films

et al. 2013

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“…The applied voltage has to be high enough in order to cause the measurable signal but it should be sufficiently small to prevent local switching and domain wall motion. Along with vertical deflection of the cantilever, a lateral motion could be detected via the friction force [4]. Since the torsional motion of the cantilever is involved, the ferroelectric must be scanned in two orthogonal directions.…”

Section: Principle Of Pfm Operationmentioning

confidence: 99%

“…Due to the small size of ferroelectric elements in MEMS, there is a growing need in microscopic techniques allowing for the evaluation of their piezoelectric properties with the nanoscale resolution. Such technique, piezoresponse force microscopy (PFM), became an interesting opportunity for the measurements of local electromechanical properties of ferroelectric films, single crystals, and even ceramics [3][4][5][6][7][8]. Along with the local measurements of piezoelectric coefficients and domain visualization, this technique allows for a direct matching of local properties to the microstructural details, since both are imaged simultaneously.…”

Section: Introductionmentioning

confidence: 99%

Nanoscale characterization of polycrystalline ferroelectric materials for piezoelectric applications

et al. 2007

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In this work, the nanoscale electromechanical properties of several important piezoelectric materials [as exemplified by PbZr x Ti 1−x O 3 (PZT)] suitable for both bulk actuator and microelectromechanical system (MEMS) applications are reported. The investigations are performed by the piezoresponse force microscopy (PFM) that is currently the most suitable tool for both ferroelectric domain imaging and local piezoelectric studies. The local piezoresponse of individual grains is measured in PZT films and compared with average piezoelectric behavior. Frequency dependencies of local piezoelectric coefficients are presented and analyzed. The results on local piezoelectric nonlinearity, as well as on nanoscale fatigue and aging are briefly discussed. These measurements demonstrate that PFM is promising for studying local piezoelectric phenomena in polycrystalline ferroelectrics where defects and other inhomogeneities are essential for the interpretation of macroscopic piezoelectric properties. Finally, local electromechanical properties of polycrystalline relaxors (PMN-PT, PLZT, doped BaTiO 3 ) are briefly outlined.

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“…Principles and image formation mechanism of PFM are described in detail elsewhere. [9][10][11] PFM is implemented on a commercial scanning probe microscopy ͑SPM͒ system ͑Veeco MultiMode NS-IIIA͒ equipped with additional function generators and lock-in amplifiers ͑DS 345 and SRS 830, Stanford Research Instruments, and Model 7280, Signal Recovery͒. A custom-built sample holder was used to allow direct tip biasing and to avoid capacitive cross talk in the SPM electronics.…”

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confidence: 99%

Electromechanical imaging of biological systems with sub-10 nm resolution

Kalinin

Jesse

Rodriguez

et al. 2008

2008 13th International Symposium on Electrets

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Electromechanical imaging of tooth dentin and enamel has been performed with sub-10 nm resolution using piezoresponse force microscopy. Characteristic piezoelectric domain size and local protein fiber ordering in dentin have been determined. The shape of a single collagen fibril in enamel is visualized in real space and local hysteresis loops are measured.Because of the ubiquitous presence of piezoelectricity in biological systems, this approach is expected to find broad application in high-resolution studies of a wide range of biomaterials.

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Three-Dimensional Electric Field Probing of Ferroelectrics on the Nanometer Scale Using Scanning Force Microscopy

Cited by 28 publications

References 22 publications

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO₃‐based Thin Films

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO₃‐based Thin Films

Nanoscale characterization of polycrystalline ferroelectric materials for piezoelectric applications

Electromechanical imaging of biological systems with sub-10 nm resolution

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Three-Dimensional Electric Field Probing of Ferroelectrics on the Nanometer Scale Using Scanning Force Microscopy

Cited by 28 publications

References 22 publications

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO3‐based Thin Films

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO3‐based Thin Films

Nanoscale characterization of polycrystalline ferroelectric materials for piezoelectric applications

Electromechanical imaging of biological systems with sub-10 nm resolution

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Product

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Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO₃‐based Thin Films

Crystallographic Orientation Dependence on Electrical Properties of (Bi,Na)TiO₃‐based Thin Films