2013
DOI: 10.1016/j.tsf.2012.10.039
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Transient phenomena in Cu(In,Ga)Se2 solar modules investigated by electroluminescence imaging

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Cited by 17 publications
(11 citation statements)
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“…A four point measurement setup was used to minimize the influence of the contact resistance. The sample was held at a constant temperature of 25 C during all the measurements via Peltier elements and water cooling. The luminescence images were taken with a Princeton Instruments Nirvana640 InGaAs camera (640 Â 512 pixels) cooled to À80 C. For the EM-PL images, the sample was held under constant illumination using a 90 W, 808 nm diode laser, with an intensity of 1 sun equivalent.…”
Section: B Experimental Resultsmentioning
confidence: 99%
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“…A four point measurement setup was used to minimize the influence of the contact resistance. The sample was held at a constant temperature of 25 C during all the measurements via Peltier elements and water cooling. The luminescence images were taken with a Princeton Instruments Nirvana640 InGaAs camera (640 Â 512 pixels) cooled to À80 C. For the EM-PL images, the sample was held under constant illumination using a 90 W, 808 nm diode laser, with an intensity of 1 sun equivalent.…”
Section: B Experimental Resultsmentioning
confidence: 99%
“…This gradient results from the different sheet resistances of the front and back contacts. 25 As the TCO has a higher sheet resistance than the Mo back contact, the photocurrent collection decreases in one direction as the collected current needs to transverse larger distances through the TCO. This effect is very similar to the change of the local voltage one sees in simple EL images but now we can quantify its influence on the charge carrier collection properties, e.g., under these conditions the probability for additionally generated charge carriers to contribute to the external current is nearly three times lower when they are generated on the right side of the cell as compared to charge carriers generated on the left side of the cell.…”
Section: B Experimental Resultsmentioning
confidence: 99%
“…Light soaking was performed at an elevated temperature T LS = 400 K for 3 h with illumination intensity of approximately 1 sun to ensure that we arrive at a saturated state. For the spatially resolved EL partly reported [33] the modules were kept in the dark overnight at room temperature prior to the transient measurements. EL pictures were taken during applied current or voltage bias every 5 seconds at ambient temperature using a Si-CCD camera.…”
Section: Methodsmentioning
confidence: 99%
“…We perform our EL measurements with a full-frame Si-CCD camera with a 3000 × 3000 pixel sensor [18], [19], while our DLIT setup contains an IR-thermography camera with a 384 × 288 pixel sensor [4]. In order to minimize the influence of metastable tranciences [19], we keep a pause period of several minutes before each EL and DLIT measurement until δV /δt ≈ 0.…”
Section: B Electroluminescence and Dark Lock-in Thermography Setupmentioning
confidence: 99%
“…In order to minimize the influence of metastable tranciences [19], we keep a pause period of several minutes before each EL and DLIT measurement until δV /δt ≈ 0. Based on the optimum lock-in parameter regions found in [15, pp.…”
Section: B Electroluminescence and Dark Lock-in Thermography Setupmentioning
confidence: 99%