2015
DOI: 10.1038/srep10013
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Tungsten Ditelluride: a layered semimetal

Abstract: Tungsten ditelluride (WTe2) is a transition metal dichalcogenide (TMD) with physical and electronic properties that make it attractive for a variety of electronic applications. Although WTe2 has been studied for decades, its structure and electronic properties have only recently been correctly described. We experimentally and theoretically investigate the structure, dynamics and electronic properties of WTe2, and verify that WTe2 has its minimum energy configuration in a distorted 1T structure (Td structure), … Show more

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Cited by 219 publications
(211 citation statements)
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“…The Raman measurement system used in this study is integrated into a home-built optical interferometry for ultrasensitive detection of motions of the suspended samples, as illustrated in Fig. 1c ) [15,16,17,18,19]. These results confirm that comparatively high crystal quality of our WTe 2 flakes is preserved throughout measurements.…”
Section: Raman Characterization Of Single-and Few-layer Wtesupporting
confidence: 67%
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“…The Raman measurement system used in this study is integrated into a home-built optical interferometry for ultrasensitive detection of motions of the suspended samples, as illustrated in Fig. 1c ) [15,16,17,18,19]. These results confirm that comparatively high crystal quality of our WTe 2 flakes is preserved throughout measurements.…”
Section: Raman Characterization Of Single-and Few-layer Wtesupporting
confidence: 67%
“…These results confirm that comparatively high crystal quality of our WTe 2 flakes is preserved throughout measurements. We compare our measured Raman results with theoretical predictions [15,16,17,18,19], in which A 1 , A 2 , B 1 , and B 2 Raman modes are expected for WTe 2 . In our measurement, it is expected that only A 1 and A 2 Raman modes would appear since the laser polarization is mostly ) exhibit high intensity among measured peaks and are well matched to the predicted Raman modes [15,16,17,18].…”
Section: Raman Characterization Of Single-and Few-layer Wtementioning
confidence: 89%
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“…We begin by characterizing the film quality to confirm that no obvious degradation happens during the sample fabrication and storage [27][28][29][30] and that they are of high enough quality to reveal the intrinsic electronic structure. Figures 1(a) all samples shown in Figs.…”
Section: Resultsmentioning
confidence: 99%