Two-tone intensity-modulated optical stimulus for self-referencing microwave characterization of high-speed photodetectors

Wang, Heng; Zhang, Shangjian; Zou, Xinhai; Zhang, Yali; Lu, Rongguo; Zhang, Zhiyao; Zhang, Xiaoxia; Liu, Yong

doi:10.1016/j.optcom.2015.08.028

Cited by 15 publications

(5 citation statements)

References 21 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Fig. 11(b) illustrates the intrinsic frequency response of the photonic sampling (i.e., the frequency response induced by the optical source), where the frequency response of the devices such as the sampling MZM and the PD is calibrated out [22], [23]. It can be seen from Fig.…”

Section: Experiments and Discussionmentioning

confidence: 99%

Frequency Response Enhancement of Photonic Sampling Based on Cavity-Less Ultra-Short Optical Pulse Source

Ma²,

et al. 2022

IEEE Photonics J.

Self Cite

View full text Add to dashboard Cite

The influence of the residual pulse chirp and the spectrum shape from a cavity-less optical pulse source on the sampling performance is theoretically analyzed. According to the theoretical analysis, an optimization method for enlarging the operation bandwidth of a photonic sampling system based on a cavity-less ultra-short pulse source is proposed and experimentally demonstrated. Through biasing the Mach-Zehnder modulator in the cavity-less optical pulse source below its quadrature point, the output spectrum flatness can be greatly improved, which is beneficial for optimizing the photonic sampling frequency response introduced by the ultrashort optical pulse train. In the experiment, the 3-dB bandwidth of the photonic sampling frequency response is increased from less than 10 GHz to more than 35 GHz by using the proposed method without sacrificing the output signal-to-noise ratio.

show abstract

Section: Experiments and Discussionmentioning

confidence: 99%

Frequency Response Enhancement of Photonic Sampling Based on Cavity-Less Ultra-Short Optical Pulse Source

Ma²,

et al. 2022

IEEE Photonics J.

Self Cite

View full text Add to dashboard Cite

show abstract

“…Note that the method is applicable for different driving levels and operating wavelengths, since it is established without any small-signal assumption. In 2016, we simplified the electro-optic stimulus based on two-tone intensity modulation [50]. As is shown in Fig.…”

Section: O/e Device Measurementmentioning

confidence: 99%

“…Schematic of the two-tone mixing for measuring PDs. MS: microwave source, DUT: device under test, PC: polarization controller, ESA: electrical spectrum analyzer[50].…”

mentioning

confidence: 99%

Accurate Calibration and Measurement of Optoelectronic Devices

Zhang

Chen

et al. 2021

J. Lightwave Technol.

Self Cite

View full text Add to dashboard Cite

Frequency responses of optoelectronic devices are essential to obtain the precise performance of electrical-to-optical-to-electrical signal conversion or optical signal processing. We reviewed the development of optical or electrical measurement methods proposed for characterizing electrical/optical (E/O) devices, optical/electrical (O/E) devices and optical/optical (O/O) devices in the frequency domain from the perspective of accurate calibration standard. It has been found that full calibrated E/O or O/E measurement requires at least an optoelectronic thru standard for the conversion between optical and electrical domains, and an electrical port extension for de-embedding the error or adapter network of microwave source or detector. The indetermination problem still exists in most O/E and E/O device characterization, which appears in different forms for different measurement techniques. Nevertheless, it should be noticed that obtaining an optoelectronic thru standard can be transferred to characterizing a microwave source or detector in the electrical domain, and a precise electrical calibration standard is much easier to be obtained as compared with an optoelectronic calibration standard. Therefore, the calibration standard transfer from optical to electrical domain is a prominent approach to solve the indetermination problem.

show abstract

“…However, to extract the individual frequency response of the PD, a calibrated IM must be employed as an electrical/optical (E/O) transducer standard, and vice versa [2]. To simplify the E/O or O/E calibration procedure, many self-calibrated methods are proposed, such as the two-tone method [3], frequency-shifted heterodyne method [4], and the photonic sampling method [5]. Nevertheless, this method is only efficient for packaged photodetectors with a good impedance match.…”

Section: Introductionmentioning

confidence: 99%

Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Jing

Wang

et al. 2022

Semiconductor Lasers and Applications XII

Self Cite

View full text Add to dashboard Cite

An improved self-reference photonic sampling method is proposed to measure the frequency response of photodiode (PD) chips. In the proposed scheme, the uneven response of the Mode-Locked Laser Source (MLLS) is eliminated by using the half-frequency photonic sampling measurements. The microwave de-embedding under short-open-load-device termination is used to realize on-chip de-embedding of the adapter network connected to the receiver of the microwave network analyzer in terms of the transmission loss and the impedance mismatch. The proposed on-chip measurement method is free of any extra electro-optical transducer standard, and an accurate measurement can still be realized without an impedance match.

show abstract

Two-tone intensity-modulated optical stimulus for self-referencing microwave characterization of high-speed photodetectors

Cited by 15 publications

References 21 publications

Frequency Response Enhancement of Photonic Sampling Based on Cavity-Less Ultra-Short Optical Pulse Source

Frequency Response Enhancement of Photonic Sampling Based on Cavity-Less Ultra-Short Optical Pulse Source

Accurate Calibration and Measurement of Optoelectronic Devices

Self-reference photonic sampling measurement of photodiode chips with microwave de-embedding

Contact Info

Product

Resources

About