1985
DOI: 10.1088/0022-3727/18/7/011
|View full text |Cite
|
Sign up to set email alerts
|

Universal correction procedure for electron-probe microanalysis. II. The absorption correction

Abstract: For pt.I see ibid., vol.18, p.1233 (1985). A new absorption correction is developed which is shown to work well for quantitative analysis of all systems including light elements. It is based upon representing the X-ray depth distributions as a quadrilateral shape defined by the mean depth of X-ray generation and the position and relative height of the peak in the X-ray depth profile. Equations for describing these parameters in terms of target material, incident electron energy, etc. are derived by reference t… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
28
0

Year Published

1988
1988
2012
2012

Publication Types

Select...
9
1

Relationship

0
10

Authors

Journals

citations
Cited by 50 publications
(28 citation statements)
references
References 11 publications
0
28
0
Order By: Relevance
“…The SEM-EDS spectra were fitted using the Oxford Instruments Link code 37,38,39 which is based on a semi-empirical general determination of the depth distribution of the X-ray excitation function due to the collision cascade of the electron beam, utilising both Monte Carlo calculations and an extensive series of measurements of tracer layers of one material in another together with self-supporting thin layers. The accuracy with which this function is estimated depends on the uncertainty in the tracer layer thicknesses (3%) and the demonstrable accuracy of the MC (also about 3%).…”
Section: Discussionmentioning
confidence: 99%
“…The SEM-EDS spectra were fitted using the Oxford Instruments Link code 37,38,39 which is based on a semi-empirical general determination of the depth distribution of the X-ray excitation function due to the collision cascade of the electron beam, utilising both Monte Carlo calculations and an extensive series of measurements of tracer layers of one material in another together with self-supporting thin layers. The accuracy with which this function is estimated depends on the uncertainty in the tracer layer thicknesses (3%) and the demonstrable accuracy of the MC (also about 3%).…”
Section: Discussionmentioning
confidence: 99%
“…For the purpose of a test of the new secondary fluorescence correction model 135 experimental values have been extracted from a database of 554 measurement data sets presented by Sewell et al [50]. 7b illustrate the effects caused by the choice of différent depth distribution functions both the absorption correction and the fluorescence correction are calculated using a variety of depth [33] (0 -0 -), Ugarte 1 [48] (-·· -), Ugarte 2 [48] (-.…”
Section: Primary Ionization Intensitiesmentioning
confidence: 99%
“…Pouchou and Pichoir used a double parabolic shape [10] or a combination of exponential shapes [11]. In a quadrilateral model [12] ~(z) was approximated by means of two straight lines. In the other works Gaussian E7, [13][14][15] or double partial Gaussian [16] profiles have been used for the O(z) approximation.…”
mentioning
confidence: 99%