Using Fourier analyses to enhance IC testability

Abstract

In this paper, we explore the potential of FFTs in digital IC tests. The effects of three parasite contact types are investigated. Results show that unappropriate logical values on output voltages are easily detected and that FFTs on supply current can make detectable undesired contacts causing additional delays. Application of the method to technologies with non small quiescent currents and to large ICs is also discussed.

IDDX-based test methods

“…The first component harmonic is usually different for fault-free and faulty I DD waveforms. Frequency spectrum analysis using an 8-point FFT was shown to be sufficient for detecting significant current waveform alterations caused by a defect [Thibeault 1994]. Frequency domain analysis is shown to be useful in detecting single and multiple faults as well as distinguishing between different faults [Hashizume et al 1988].…”