Vibrational properties of epitaxial films on metals. II. fcc Ni on the Cu(001) surface

Chen, Y.; Wu, Zhibiao; Yao, Jiachi; Tong, S. Y.

doi:10.1103/physrevb.39.5617

Cited by 5 publications

(2 citation statements)

References 8 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…However, the dynamic behavior of the system during film growth is very important. From the standpoint of vibrational properties, the interaction of nickel with substrate atoms initiates the formation of new localized or resonant modes, which affects the phonon subsystem and the growth conditions for the deposited film [15][16][17][18][19]. It should be noted that this aspect has not been considered comprehensively analyzing the stable growth of the Ni film on a Cu(100) surface.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Structure and phonon spectrum of a submonolayer Ni film on the surface of Cu(100)

Rusina

Borisova

Chulkov

2016

J. Exp. Theor. Phys.

View full text Add to dashboard Cite

The equilibrium atomic structure and the phonon spectra of a submonolayer (θ = 0.5 monolayer) Ni film deposited on the surface of Cu(100) are calculated using the potentials obtained by the embedded atom method. We consider atomic relaxation, the vibrational state density distribution on Ni and substrate atoms, and polarization of vibrational modes. Variation of the phonon spectrum upon segregation of Cu atoms on the film surface is considered. It is shown that mixing of vibrations of Ni adatoms with vibrations of substrate atoms occurs in the entire frequency range, leading to a frequency shift of the vibrational modes of the substrate and to the occurrence of new vibrational states atypical of a clean surface. The Cu(100)-c(2 × 2)-Ni structure is dynamically stabler when placed in the subsurface layer of the substrate.

show abstract

Section: Introductionmentioning

confidence: 99%

“…The frequencies of the Rayleigh mode and surface resonance for a film with a thickness of 1-2 monolayers (ML) were measured using high-resolution electron energy loss spectroscopy (HREELS) [15]. Theoretical calculations were also carried out only for films with a thickness from 1 to 4 ML using model methods [16,[19][20][21].…”

Section: Introductionmentioning

confidence: 99%