2006
DOI: 10.1016/j.microrel.2006.02.011
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Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications

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Cited by 3 publications
(1 citation statement)
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“…The last 5 years, LDMOS transistors for cellular base stations power amplifiers has gone through a tremendous development with a spectacular improvement in available output power, power gain, power added efficiency and linearity together with improvements in hot carrier reliability and thermal resistance [1,2]. This was fueled by introduction of new device architectures such as new shield construction and by introduction of LDMOS technology to advanced CMOS fabs.…”
Section: Introductionmentioning
confidence: 99%
“…The last 5 years, LDMOS transistors for cellular base stations power amplifiers has gone through a tremendous development with a spectacular improvement in available output power, power gain, power added efficiency and linearity together with improvements in hot carrier reliability and thermal resistance [1,2]. This was fueled by introduction of new device architectures such as new shield construction and by introduction of LDMOS technology to advanced CMOS fabs.…”
Section: Introductionmentioning
confidence: 99%