Worst case analysis of linear analog circuit performance based on Kharitonov's rectangle

Qian, Liuxi; Zhou, Dian; Wang, Sheng-Guo; Xuan, Xuan; Zeng, Liangen

doi:10.1109/icsict.2010.5667428

Cited by 12 publications

(11 citation statements)

References 5 publications

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“…Among them, sensitivity analysis [Vlach and Singhal 1995], sampling method [Spence and Soin 1988], and interval arithmetic-based approaches [Kolev et al 1988;Tian et al 1996;Shi and Tian 1999;Qian et al 2010] have their advantages in well-suited scenarios. However, sensitivitybased methods cannot give the worst case in general; sampling-based methods are limited to a few number variables; and interval arithmetic methods have the notoriety of being overly pessimistic.…”

Section: Introductionmentioning

confidence: 99%

“…However, sensitivitybased methods cannot give the worst case in general; sampling-based methods are limited to a few number variables; and interval arithmetic methods have the notoriety of being overly pessimistic. Recently, worst-case analysis of linearized analog circuits in frequency domain has been proposed [Qian et al 2010], where Kharitonov's functions [Kharitonov 1978] were applied to obtain the performance bounds in frequency domain, but no systematic method was proposed to obtain variational transfer functions. This was later improved by Hao et al [2011], where symbolic analysis approach was applied to derive exact transfer functions, and affine interval method was used to compute variational transfer functions.…”

Section: Introductionmentioning

confidence: 99%

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Performance bound analysis of analog circuits in frequency- and time-domain considering process variations

Liu

Tan

Palma-Rodriguez

et al. 2013

ACM Trans. Des. Autom. Electron. Syst.

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In this article, we propose a new performance bound analysis of analog circuits considering process variations. We model the variations of component values as intervals measured from tested chips and manufacture processes. The new method first applies a graph-based analysis approach to generate the symbolic transfer function of a linear(ized) analog circuit. Then the frequency response bounds (maximum and minimum) are obtained by performing nonlinear constrained optimization in which magnitude or phase of the transfer function is the objective function to be optimized subject to the ranges of process variational parameters. The response bounds given by the optimization-based method are very accurate and do not have the overconservativeness issues of existing methods. Based on the frequency-domain bounds, we further develop a method to calculate the time-domain response bounds for any arbitrary input stimulus. Experimental results from several analog benchmark circuits show that the proposed method gives the correct bounds verified by Monte Carlo analysis while it delivers one order of magnitude speedup over Monte Carlo for both frequency-domain and time-domain bound analyses. We also show analog circuit yield analysis as an application of the frequency-domain variational bound analysis.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Performance bound analysis of analog circuits in frequency- and time-domain considering process variations

Liu

Tan

Palma-Rodriguez

et al. 2013

ACM Trans. Des. Autom. Electron. Syst.

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“…However, the monotonicity between circuit response and uncertain parameters is not satisfied in most analog circuits. The worst case analysis approach based on Kharitonov's method requires all polynomial coefficient variations in the system transfer function to be independent from each other [5]. Unfortunately, most real circuits do not satisfy this constraint.…”

Section: Introductionmentioning

confidence: 99%

An Efficient Method for Evaluating Analog Circuit Performance Bounds Under Process Variations

Kuo

Saibua

Huang

et al. 2012

IEEE Trans. Circuits Syst. II

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The continued scaling of the minimum feature size of contemporary chips has made circuit performance increasingly susceptible to the process variations. Many approaches have been proposed to estimate the circuit performance bounds with respect to process or circuit parameter variations in the recent years. The Monte Carlo method is the most popular one among them. However, this method usually produces underestimated results and needs a large number of simulation runs to achieve an accurate estimation. The approach based on Kharitonov's method has been recently proposed. This method requires all coefficient variations in the system transfer function to be independent from each other. Unfortunately, most real circuits do not satisfy this constraint. Therefore, it tends to overestimate the performance bounds in real application due to the parameter-independent requirement. This short paper proposes an optimization approach on a transfer function of a linear circuit to evaluate the performance bounds under process variations. The magnitude and phase bounds of a linear system can be calculated by the proposed method at each frequency point. Furthermore, the parameter-independent requirement in Kharitonov's method is resolved by the proposed method. The proposed method has been applied to a CMOS two-stage amplifier. The experimental result shows that it evaluates the magnitude and phase bounds of a linear system accurately in much less computation time as compared with the Monte Carlo method. All experimental results were carried out using a standard 0.35-µm CMOS process technology.

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“…Worst-case circuit tolerance analysis, which calculates the lower bounds and upper bounds of circuit response under parameter variations, has been widely used and studied in the literature [1,[3][4][5][6][7][8][9]. Designing to worst-case circuit tolerance requirements guarantees product will function properly, regardless of the actual parameter variations.…”

Section: Introductionmentioning

confidence: 99%

Circuit tolerance design by differential evolution with hybrid analysis method

Zhong

Li²,

Yuan

2016

2016 Eighth International Conference on Advanced Computational Intelligence (ICACI)

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With the continued scaling down of electronic device dimensions, circuit design under parameter variations has received increasing interests. In this paper, a new method that combine the differential evolution with hybrid analysis method is presented to solve the worst-case circuit tolerance design problem. The hybrid analysis method is comprised of two commonly used worst-case circuit tolerance analysis approaches, vertex analysis and Monte Carlo analysis. The search direction of differential evolution is leaded by vertex analysis at the first stage, through which we can reduce the computational complexity of fitness calculation dramatically. Monte Carlo analysis, a higher accuracy analysis method, is applied to ensure the quality of the solutions at the second stage. Some of the individuals are reinitialized to enhance the diversity of the population at the beginning of the second stage. By cooperating the two analysis methods, the proposed method can converge to the global optimum or nearoptimum solutions more quickly. The experiment results show the effectiveness and efficiency of proposed techniques for the circuit tolerance design.

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Worst case analysis of linear analog circuit performance based on Kharitonov's rectangle

Cited by 12 publications

References 5 publications

Performance bound analysis of analog circuits in frequency- and time-domain considering process variations

Performance bound analysis of analog circuits in frequency- and time-domain considering process variations

An Efficient Method for Evaluating Analog Circuit Performance Bounds Under Process Variations

Circuit tolerance design by differential evolution with hybrid analysis method

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