X-ray Full Field Microscopy at 30 keV

Marschall, Felix; Simon, M.; Kluge, Martin; Nazmov, V.; Vogt, Harald; Ogurreck, Malte; Greving, Imke; Mohr, Jürgen

doi:10.1088/1742-6596/499/1/012007

Cited by 24 publications

(18 citation statements)

References 2 publications

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“…A combination of two exposures (at ±45°) on one substrate yields integrated lenses for 2D-imaging in an astigmatism-free design. For enlarging the field of view, an aperture-optimized lens design was used [13,14]. A rolled X-ray prism lens was used as condenser and allowed a peak gain of 48× in an angular range tailored to the numerical aperture of the objective CRL.…”

Section: Resultsmentioning

confidence: 99%

Layout and first results of the nanotomography endstation at the P05 beamline at PETRA III

Ogurreck¹,

Greving²,

Marschall³

et al. 2016

AIP Conference Proceedings

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Abstract. The Helmholtz-Zentrum Geesthacht operates the P05 Imaging Beamline at the DESY storage ring PETRA III. This beamline is dedicated to micro-and nanotomography with two endstations. This paper will present the nanotomography endstation layout and first results obtained from commissioning and test experiments.First tests have been performed with CRLs as X-ray objectives and newly developed rolled X-ray prism lenses as condenser optics. This setup allows a resolution of 100 nm half period with an effective detector pixel size of 15nm. A first tomograph of a photonic glass sample was measured in early 2014.

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Section: Resultsmentioning

confidence: 99%

Layout and first results of the nanotomography endstation at the P05 beamline at PETRA III

Ogurreck¹,

Greving²,

Marschall³

et al. 2016

AIP Conference Proceedings

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“…The imaging resolution of these lenses was determined to be $150 nm in a separate experiment. More details on such lenses and their imaging properties are given by Marschall et al (2014).…”

Section: Setupmentioning

confidence: 99%

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

et al. 2014

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Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X‐ray science in the form of X‐ray topography. Over the past two decades, interest in X‐ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full‐field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X‐ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a = 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

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“…The recently introduced X-ray zoom lens [5,6] can keep a fixed working distance and constant magnification factor over a required energy range. This X-ray zoom lens consists of SU-8 lens elements fabricated by deep X-ray lithography [7][8][9] and positioned on bendable zoom lens fingers. The focal length can be adjusted by bending lens elements in or out of the beam path.…”

Section: Introductionmentioning

confidence: 99%

X-ray zoom lens allows for energy scans in X-ray microscopy

et al. 2019

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We introduce a new design and development of a compound refractive X-ray zoom lens for energy scans in X-ray microscopy. Energy scans are, in principle, equivalent to radial scans in the reciprocal space for X-ray diffraction. Thanks to the absence of sample or detector motions, energy scans are better suited for microscopy, which requires high stability. In addition, close to the absorption edge of an element, energy scans can yield chemical information when coupled with resonant effects in either full field diffraction X-ray microscopy (FFDXM) or X-ray absorption near edge structure (XANES) microscopy. Here, we demonstrate the concept by using a customized compound refractive X-ray zoom lens for 11 keV near the Ge Kαedge. The working distance and magnification were kept constant during the energy scans by adapting the lens composition on switchable zoom lens fingers. This alleviates the need to reposition the lens while changing the energy and makes quantitative analysis more convenient for FFDXM. The fabricated zoom lens was characterized and proven suitable for the proposed measurement.

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X-ray Full Field Microscopy at 30 keV

Cited by 24 publications

References 2 publications

Layout and first results of the nanotomography endstation at the P05 beamline at PETRA III

Layout and first results of the nanotomography endstation at the P05 beamline at PETRA III

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

X-ray zoom lens allows for energy scans in X-ray microscopy

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