The homogenization of light is widely applied in various industrial sectors. The uniform high power processing of large areas requires a high degree of homogeneity. Sophisticated beam transformation techniques are used to optimize the illumination of standard optical diffusers such as microlens arrays and decrease the contrast of interference. Novel design techniques take advantage of a multimodal approach which is especially adapted to the characteristic properties of the laser light source. We show how anamorphic beam shaping is employed to transform the high power light source in order to meet the required level of homogeneity suited for the respective application.

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We have implemented and successfully tested an off-axis transmission Fresnel zone plate as spectral analyzer for resonant inelastic X-ray scattering (RIXS). The imaging capabilities of zone plates allow for advanced two-dimensional (2D) mapping applications. By varying the photon energy along a line focus on the sample, we were able to simultaneously record the emission spectra over a range of excitation energies. Moreover, by scanning a line focus across the sample in one dimension, we efficiently recorded RIXS spectra spatially resolved in 2D, increasing the throughput by two orders of magnitude. The presented scheme opens up a variety of novel measurements and efficient, ultra-fast time resolved investigations at X-ray Free-Electron Laser sources.

Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X‐ray science in the form of X‐ray topography. Over the past two decades, interest in X‐ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full‐field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X‐ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a = 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

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