X-ray photoelectron diffraction investigation of the cleavage plane in -transition metal dichalcogenides

Time and Angle-Resolved Time-of-Flight Electron Spectroscopy for Functional Materials Science

“…The symmetrized diffraction pattern is a result of integrating the spectra within the kinetic energy range from 811 eV to 815 eV and is depicted in Figure 3b. One main Kikuchi band is clearly visible as well as the 3-fold symmetry [20]. Although the obtained pattern is only showing a ±28 • region of the full pattern, one can see the characteristic features of a chalcogen terminated surface [20].…”

“…One main Kikuchi band is clearly visible as well as the 3-fold symmetry [20]. Although the obtained pattern is only showing a ±28 • region of the full pattern, one can see the characteristic features of a chalcogen terminated surface [20]. The Ta 4f trPES of TaS 2 has been studied earlier, for example at the FLASH free-electron facility in Hamburg [4,16] and using an HHG pulsed laser system [21].…”

“…From a scientific point of view, the aspect of simultaneous acquisition of chemical ESCA and structural XPD information from the same sample site is a major advantage. To benchmark such performance, we conducted an X-ray photoelectron diffraction (XPD) experiment using again 1T-TaS 2 as our model functional material, which is well understood, and we can compare to published results [20]. As shown in Figure 3b), the full photoelectron diffraction pattern is readily observed, with the photoemission spectrum being also accessible by integration over the emission angles.…”