The authors in paper [1] are presented the new automatic test equipment (ATE) for digital integrated circuits based on the signature analysis. This work introduced a complete framework for the testing of the printed circuit boards (PCBs) of the digital integrated circuits. In this paper, the Field Programmable Gate Array (FPGA) implementation of this new ATE is presented. The timing simulation and then design download are presented on the Spartan Xilinx chip (X2S400EFT256-7). In this paper, the concept of the portable ATE is presented that reduces the complexity of the traditional ATE. This compacted testing system approach is designed to apply the test pattern to the circuit under test (CUT) and to compact the response of the CUT by signature analyzer. The timing controller and the parallel port of the personal computer (PC) generate all required signals to control all steps of the test cycle for proper operation.

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Several studies were oriented to the investigation of the porous structure of woven fabrics [9][10][11]. Through several studies have treated the pores as cylinders with a permanent cross-section over all its length, the pore size and shape are completely uneven. The same is valid for the pore distribution in the woven fabric [12]. AbstractDue to the complexity of fabric structure, modeling of pore structure and predicting the pore parameters are difficult. This paper presents a novel approach to determine textile pore size, porosity and pore size distribution by the application of the image analysis techniques. In this study, it has been attempted to establish a theoretical model for both the pore size and porosity of woven fabrics. For this purpose, a theoretical model of porous systems based on Poiseuille's law was used to predict the pore size of woven fabrics. Also a theoretical model was created to predict the porosity of a woven fabric depending on the geometrical parameters. The two characteristics of pore opening size and porosity were determined from image analysis and were compared to the results from laboratory tests. The validity of which was confirmed by experimental results using cotton plain woven fabrics produced from different yarn linear density and tightness. A new and accurate method of image analysis for pore size distribution (PSD) determination of woven fabrics is presented in this paper. The tested fabric sample could be ranked in a decrease order successfully.

In this paper, a complete example for BIST (Built-In Self-Test) boundary scan architecture and 16-bit multiplier as the CUT is presented. Adding BIST boundary scan capabilities to the digital VLSI integrated circuit design makes the electronic card testable from five pins TMS, TCK, TDI, TDO and TRST* that is optional. The simulation and then design download are presented on the Spartan Xilinx X2C100 chip. The hardware implementation is tested using the interfacing through the parallel port of the personal computer that supplies required five control pins. This approach will lead to the concept of the portable ATE (Automatic Test Equipment). All required test circuitry is embedded in the integrated circuits and the control of the test circuitry is supplied from the TAP (Test Access Port) controller. Finally, the TAP controller is controlled from the parallel port of the personal computer. So, the personal computer is used as a master controller and the TAP controller is used as a slave controller. The presented idea of the new BIST testing architecture solves the testing problem of the digital VLSI circuits using the traditional ATE.

Infrared (IR) imaging became one of the most important image sources and is used now in different applications. Thus, the compression of IR images became very important for the transmission and storage purposes. The application of the subband coding in the Wavelet domain (SCWD) to IR images shows a good tool to reduce the image redundancy. In this paper, the SCWD is applied to IR images with one and two levels of decomposition and the results are compared with a standard image. The application ofthe SCWD to IR images gives a bit rate of 1.25 bpp with very high PSNR and excellent perceptual quality. Also, a bit rate of 0.3 12 bpp is obtained with high PSNR and very good perceptual quality of the reconstructed image.