Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.
A 0.4 dB excess loss, 0.01 dB output channel imbalance polymer 1 3 MMI power splitter is modeled having linearly tapered input section suitable for use in an optical backplane connector. The device design was additionally optimized using FD-BPM to have a good tolerance to source lateral misalignments.
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