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Surface treatments on surfaces in front of emissive displays are widely used to improve readability under difficult lightning conditions, especially involving sunlight. So‐called anti‐glare (AG) surface treatment tries to reduce specular reflection by diffuse scattering creating a matt finish. At the same time, this surface treatment has a direct impact on the image quality in transmission. For that it is important to tailor these surfaces according to the application requirements but at the same time maintain the image quality of the underlying displays. One of the undesired effects is the so‐called “visual sparkle”, where the displayed image appears to show an uneven luminance distribution especially in areas where solid colors are shown. Great effort and different approaches have been made to characterize this effect. In this work we present a simple, yet effective approach of characterization based on the evaluation of image uniformity with help of grey value histogram extraction and fitting a simple normal distribution..

A four-mask low-temperature poly-Si (LTPS) TFT process for pand n-channel devices has been developed. PECVD-deposited amorphous silicon was recrystallized to polycrystalline-silicon with single-area excimer-laser crystallization, while the gate dielectric was fabricated by PECVD deposition of a SiH 4 -N 2 O-based silicon oxide. Formation of drain and source was carried out with selfaligned ion-beam implantation. To prove the potential capability of these devices, which are suitable for conventional and inverted OLEDs alike, several functional active-matrix backplanes implementing different pixel circuits have been produced. This active-matrix backplane process has been customized to drive small molecules as well as polymers regardless if its structure is top or bottom emitting.

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