This paper proposes a fully-digital BIST architecture for the dynamic test of Σ∆ ADCs. The proposed BIST relies on generating a ternary stream that encodes a high-linearity analog sinusoidal and injecting it directly at the input of the Σ∆ modulator. Compared to the well-known bitstream, the use of three logic levels in the ternary stream reduces the quantization noise and, thereby, results in a test with a higher dynamic range that covers the full scale of the ADC. The output response is analyzed on-chip using a simplified version of the sine-wave fitting algorithm to compute the SNDR. A standard SPI bus provides digital external access to the embedded test instruments. The proposed BIST wrapper has been integrated into a 40 nm CMOS 18-bit stereo audio Σ∆ ADC IP core provided by ST Microelectronics. It incurs an overall area overhead of 7.1% and the total test time is 28ms per channel. Experimental results on fabricated chips demonstrate an excellent correlation between the BIST and the standard functional specification test.

International audienc

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This paper presents an Embedded Test Instrument (ETI) for the estimation of the High Frequency (HF) jitter of an observed clock signal. The ETI uses a second reference clock for under-sampling the observed signal similar to previous approaches. However, the analysis of the test response does not require the construction of the Cumulative Distributed Function (CDF) of the jitter as in previous approaches. Instead, the HF jitter of the input observed signal is transformed at the output of the ETI into a digital value that corresponds to a number of unwanted signal transitions. We demonstrate in this paper that the transfer function of the ETI defined by the ratio of the number of unwanted signal transitions and the input HF jitter is linear. This property leads to a simple circuit implementation. The linearity of the ETI is demonstrated firstly by behavioral simulation, using a theoretical model of the output of the undersampling process, and secondly by transistor-level simulation using the 65 nm CMOS bulk technology by ST Microelectronics.We also present experimental measurements that have been carried out using an FPGA-based test platform to validate the linearity of the transfer function in the presence of non-idealities that can affect the ETI. Finally, we demonstrate the exploitation of the ETI within Systems-on-Chip (SoCs) produced in highvolume by ST Microelectronics.

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