An adiabatic 64-kb SRAM circuit with shared reading and writing ports was designed, which enables gradual charging and discharging while maintaining a large VDD so that the problems of V T variation and electromigration in the nanocircuit can be solved. In the writing mode, the voltage of the memory cell ground line is increased to VDD/2 gradually, and the nMOSFET is turned off so that the memory cell ground line is set in a high-impedance state. Data can then be written easily by decreasing the voltage of one bit line adiabatically, while the voltage of the other bit line remains high. For reading, using the shared reading port, the voltage swing of the global bit-line can be decreased to VDD/4 so that the problems of electromigration can be solved. The reading method enables a gradual current flow in the memory cell. We designed the cell layout and confirmed that the number of transistors in the cell is quasi-six. In addition, two types of new step voltage circuits with tank capacitors are proposed. One is for producing the memory cell ground line voltage and the other for charging the word line voltage adiabatically. Spontaneous step voltage formation is confirmed experimentally.

Four definitions of static random access memory (SRAM) cell write margins (WMs) were reexamined by analyzing the dependence of the WM on the SRAM cell transistor threshold voltages (Vth's) in order to find a preferable definition. The WM is expected to obey the normal distribution if the differential coefficients of the WM to Vth's are constant over a wide range of Vth variations. This means that the write yield can be easily predicted by a small number of measured samples. Using SPICE in 45-nm technology, we examined which definition had Vth linearity, as well as giving an accurate write limit. The distribution predicted from the linearity was verified by the Monte Carlo simulation. As a result, the definition proposed by Gierczynski et al. was found to be the most suitable definition for predicting the distribution and the write yield.

Abstract-A 64-kb SRAM circuit with a single bit line (BL) for reading and with two BLs for writing was designed. Single-BL reading is achieved by using a left access transistor and a left shared reading port. We designed the cell layout and confirmed that there is no area penalty for producing two word lines in a memory cell. An analysis of butterfly plots clearly confirms that the single-BL SRAM has the larger static noise margin than the two-BL one. It is confirmed that the static noise margin in the single-BL SRAM is further increased when the BL is precharged to not VDD but to the lower value in the range of VDD/2 to 3VDD/4. In addition, a new sense amplifier circuit without reference voltage is proposed for single-BL reading. We also propose a divided word line architecture for writing to maintain the static noise margin for unwritten blocks.

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We have studied partial discharge (PD) localization method on power cable. PD localization in power cable can be generally made from the arrival time interval measured by two devices placed at the terminal of both ends of the measurement section. However, there is a cost problem in this technique because of need of the optical fiber installation. In this paper, we propose a new PD localization method in power cables using atomic clocks that allow retention of high-precision synchronization of relative time difference between two PD measuring devices. To evaluate overall accuracy of the proposed method, experiments of location identification were carried out using coaxial cables which simulate power cables. In addition, to compensate a synchronization error, we also proposed a modified method by comparing the timing of 1PPS signal (pulse generated by atomic clocks per second continuously) of each atomic clock, and showed how the method worked.