This paper introduces a complete simulation model of a Direct Power Injection (DPI) setup, used to measure the immunity of integrated circuits to conducted continuous-wave interference. This model encompasses the whole measurement setup itself as well as the integrated circuit under test and its environment (printed circuit board, power supply). Furthermore, power losses are theoretically computed, and the most significant ones are included in the model. Therefore, the injected power level causing a malfunction of an integrated circuit, according to a given criterion, can be identified and predicted at any frequency up to 1 GHz. In addition to that, the relationship between immunity and impedance is illustrated. Simulation results obtained from the model are compared to measurement results and demonstrate the validity of this approach.

The ICEM standard (Integrated Circuit Electromagnetic Modei) was proposed by the French standard committee (UTE) where many semi-conductor manufacturers and final users are involved. The ICEM standard proposal is nowadays registered as a Technical Report (IEC62014-3). h the first part of this paper, the authors will present the architecture of the model. In the second part. they will describe different methods to characterize the parameters of the model. Finally, comparisons between measurement and simulation results highlight the capability of this approach for the prediction of the electromagnetic emission of an IC.

No abstract

No abstract

No abstract