A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is presented. The fault and error models of a large class of VLSI ALU designs are discussed. The proposed design is proved to be fault-secure and self-testing with respect to any single fault in the ALU part. The proposed BCP ALU is proved to be SFS with any design of BCP circuit. Consequently, a self-checking processor whose data path is encoded entirely in a Berger code can be achieved. An efficient self-checking processor can then be designed

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ISBN: 0818628758The authors present a novel scheme for implementing self-checking circuits in static CMOS. A strongly code disjoint (SCD) built-in current sensor (BICS) is presented. It is used to cover faults whose detection cannot be guaranteed by logic monitoring. A previously fabricated and tested high-speed BICS is examined for its behavior in the presence of faults. Then, a self-exercising mechanism is designed to obtain the SCD property. The integration of this SCD BICS with a self-checking circuit achieves the well-known goal of total self-checking

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