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Dark-line defects (DLDs) of threading dislocation origin in strained InGaAs/AlGaAs quantum well laser diodes were observed by the electron-beam induced current technique. Current density dependence for the DLD growth velocity was compared quantitatively with that for unstrained GaAs/AlGaAs quantum well laser diodes for the first time. The <110>DLD growth velocity in InGaAs QW laser diodes is estimated to be about 1/100 of that for the <100>DLD growth in the GaAs QW laser diodes, showing linear dependence on injected current densities.

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