Scanning electrochemical-atomic force microscopy (SECM-AFM) is a powerful technique that can be used to obtain in situ information related to electrochemical phenomena at interfaces. Fabrication of probes to perform SECM-AFM experiments remains a challenge. Herein, we describe a method for formation of microelectrodes at the tip of commercial conductive AFM probes and demonstrate application of these probes to SECM-AFM. Probes were first insulated with a thin parylene layer, followed by subsequent exposure of active electrodes at the probe tips by mechanical abrasion of the insulating layer. Characterization of probes was performed by electron microscopy and cyclic voltammetry. In situ measurement of localized electrochemical activity with parylene-coated probes was demonstrated through measurement of the diffusion of Ru(NH)(6)(3+) across a porous membrane.

Carbon electrodes coupled with electrochemical detection have been used extensively for the investigation of biogenic amines. Herein we report the fabrication and characterization of carbonaceous electrodes prepared from pyrolyzed parylene C (PPC) films. High-aspect ratio carbonaceous microelectrodes have been prepared by masking PPC coated pipettes with an insulating parylene C film. PPC thin film electrodes were characterized electrochemically, spectroscopically, and with electron microscopy. The procedures described here offer a route to fabrication of thin film carbon electrodes that can be patterned and produced in parallel. These electrodes are similar to carbon electrodes derived from pyrolyzed photoresist films but do not require spin-coating or lithography and can readily coat three-dimensional surfaces.

This review aims to describe the operation of atomic force microscopy related to the study of disease states and single cell analysis, and to serve as an overview of recent advances in this subject area.

Conductive atomic force microscopy (AFM) probes fabricated from silicon cantilevers coated with pyrolyzed parylene C (PPC) are described. This method offers a simple, inexpensive route to conductive AFM probes made from carbon materials. Fabricated probes were used in current-sensing atomic force microscopy (CS-AFM) to image nanometer-sized, metallic features. Future applications of PPC AFM probes include measurement of in situ corrosion and scanning electrochemical-atomic force microscopy.

We have previously reported pyrolyzed parylene C (PPC) as a conductive carbon electrode material for use with micropipets, atomic force microscopy probes, and planar electrodes. Advantages of carbon electrode fabrication from PPC include conformal coating of high-aspect ratio micro/nanoscale features and the benefits afforded by chemical vapor deposition of carbon polymers. In this work, we demonstrate chemical surface doping of PPC through the use of previously reported methods. Chemically treated PPC films are characterized by multiple spectroscopic and electronic measurements. Pyrolyzed parylene C and doped PPC are used to construct diodes that are examined as both p-n heterojunction and Schottky barrier diodes. Half-wave rectification is achieved with PPC diodes and demonstrates the applicability of PPC as a conductive and semiconductive material in device fabrication.