A grating spectrograph in InGaAsP/InP suitable for use in the wavelength region from 1.2 to 1.6 μm is presented. Experiments for devices with a channel spacing of 3.7 nm and more than 30 channels between 1.48 and 1.59 μm are described. The measured cross talk level is below −25 dB. The devices have only very low polarization sensitivity. This spectrograph is suited for monolithic integration with photodiodes, laser diodes, or optical amplifiers on a single chip.

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