This work presents the first atomic scale evidence for ferroelectric polarization inversion on the unit cell level in a wurtzite-type material based on epitaxial Al0.75Sc0.25N thin films. The electric field induced formation of Al-polar inversion domains in the originally N-polar film is unambiguously determined by atomic resolution imaging using aberration-corrected scanning transmission electron microscopy (STEM). Anisotropic etching supports STEM results confirming a complete and homogenous polarization inversion at the film surface for the switched regions and the virtual absence of previous inversion domains in as-deposited regions. Local evidence of residual N-polar domains at the bottom electrode interface is observed and can be explained by both stress gradients and electric field deflection. The epitaxial relationship of the sapphire/AlN/Mo/AlScN multilayer stack is discussed in detail. Selected-area electron diffraction experiments and XRD pole figures reveal a Pitsch–Schrader type orientation relation between the Mo electrode and the AlScN film.

We present results on the growth of CdTe-HgTe core-shell nanowires, a realization of a quasi one-dimensional heterostructure of the topological insulator HgTe. The growth is a two step process consisting of the growth of single crystalline zinc blende CdTe nanowires with the vapor-liquid-solid method and the overgrowth of these wires with HgTe such that a closed shell is formed around the CdTe core structure. The CdTe wire growth is monitored by RHEED allowing us to infer information on the crystal properties from the electron diffraction pattern. This information is used to find and control the optimal growth temperature. High quality single crystal CdTe nanowires grow with a preferred orientation. For the growth of the conductive HgTe shell structure we find that the supplied Hg:Te ratio is the crucial parameter to facilitate growth on all surface facets

In this letter we report on proximity superconductivity induced in CdTe-HgTe coreshell nanowires, a quasi-one-dimensional heterostructure of the topological insulator HgTe. We demonstrate a Josephson supercurrent in our nanowires contacted with superconducting Al leads. The observation of a sizable I c R n product, a positive excess current and multiple Andreev reflections up to fourth order further indicate a high interface quality of the junctions.

We investigate the crystal properties of CdTe nanowires overgrown with HgTe. Scanning electron microscopy (SEM) and scanning transmission electron microscopy (STEM) confirm, that the growth results in a high ensemble uniformity and that the individual heterostructures are single-crystalline, respectively. We use highresolution X-ray diffraction (HRXRD) to investigate strain, caused by the small lattice mismatch between the two materials. We find that both CdTe and HgTe show changes in lattice constant compared to the respective bulk lattice constants. The measurements reveal a complex strain pattern with signatures of both uniaxial and shear strains present in the overgrown nanowires.

A‐plane Al0.7Sc0.3N ( 11 2 false¯ 0 ) thin films are grown on r‐plane Al2O3( 1 1 false¯ 02 ) substrates using reactive pulsed‐DC magnetron sputter epitaxy. This is the first report of successful synthesis of nonpolar epitaxial AlScN films with a high scandium concentration (30%). The influence of different sputtering conditions, such as magnetron power, temperature, and process gas flow rates, is investigated. The film characteristics are also compared on different substrate offcuts. Controlling the diffusion of adatoms on surface of the substrate is found to have the highest influence on film quality. The X‐ray diffraction measurements confirm in‐plane oriented AlScN ( 11 2 false¯ 0 ) layers and the final optimized films show significant improvement in rocking curve full width at half maximum (ω‐FWHM) of 11 2 false¯ 0 reflection. Corresponding atomic force microscopy (AFM) measurements show mean root square surface roughness (R q < 0.4 nm) nearing atomically smooth levels. The optimized films also exhibit anisotropic growth characteristics. A growth model for a‐plane AlScN has been proposed based on the growth parameters of the film.