Liquid crystal displays (LCDs) and organic light emitting diodes (OLEDs) are the technology involved in electronic displays in order to get a better viewing angle and high-density resolution products. Fine-pitch, flip-chip interconnection is one method which is able to enhance the display performance with high color resolution. Nonconducting film (NCF) is a novel material developed for fine-pitch applications. This study investigates the temperature effect on the electrical contact performance of an NCFbonded chip-on-flexible (COF) substrate package. The changes in contact resistance after reflow at a peak temperature of 260 C for three times were measured with a four-point probe method. The bonding temperature has a significant effect on the peel strength of the NCF-bonded COF. A high peel strength for the NCF COF bonded at a high temperature indicated that the NCF obtained sufficient mechanical strength to hold the interconnection joints. A low bonding temperature is preferable to obtain good electrical contact, but sufficient high temperature is needed to ensure a good mechanical and reliable joint. An excessively high bonding temperature is to be avoided because it gives instant curing at the contact point which restricts good electrical conduction. An NCF with a curing degree of 86% was needed to ensure sufficient and reliable electrical joints in the COF.

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Electronic portable devices are aimed towards higher response speed with a better viewing resolution display. Nonconductive paste (NCP) and nonconductive film (NCF) are the adhesive materials used in fine-pitch display applications. This study compares two commercially available adhesives for fine-pitch chip-on-flex (COF) applications. The electrical performance of the NCP-bonded COF was better compared to the NCF. The rheological properties of these materials in the initial stages and the mechanical properties of the adhesives after bonding are claimed to be the main factors. The semisolid form of the NCF which melts and flows slowly from the interconnection joints finally reduced the effective contact area in the joint as compared to the NCP. A low-pressure bonding caused entrapment of adhesive in the joints, induced stress accumulation in the -direction during high thermal loading, and a high coefficient of thermal expansion (CTE) mismatch in between bumps, adhesive, and electrode traces on the flexible substrate were the key factors for the degradation of electrical conductivity. A high load of 100 N and above was recommended since the effective contact area built into the interconnection was good and reliable after 400 cycles of a thermal shock test of 55 C-125 C. The NCP with a higher elastic modulus which ensures higher stiffness and stability towards elongation gave a better reliability in this environmental test. Cross sectioning and SEM analysis provide evidence of the effective contact area of the joint before and after the thermal cycle environmental test.

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