A device that is
able to produce single photons is a fundamental
building block for a number of quantum technologies. Significant progress
has been made in engineering quantum emission in the solid state,
for instance, using semiconductor quantum dots as well as defect sites
in bulk and two-dimensional materials. Here we report the discovery
of a room-temperature quantum emitter embedded deep within the band
gap of aluminum nitride. Using spectral, polarization, and photon-counting
time-resolved measurements we demonstrate bright (>10
5
counts
s
–1
), pure (
g
(2)
(0)
< 0.2), and polarized room-temperature quantum light emission from
color centers in this commercially important semiconductor.
Among wide-bandgap compound semiconductors, gallium nitride is the most widely available material due to its prevalence in the solid state lighting and high-speed/high-power electronics industries. It is now known that GaN is one of only a handful of materials to host color centers that emit quantum light at room temperature. In this paper, we report on a bright color center in a semi-polar gallium nitride substrate emitting at room temperature in the near-infrared. We show that a hemispherical solid immersion lens, near index matched to the semiconductor, can be used to enhance the photon collection efficiency by a factor of 4.3 ± 0.1 while improving the lateral resolution by a factor equal to the refractive index of the lens.
Color centers in wide-bandgap semiconductors are a promising class of solid-state quantum light source, many of which operate at room temperature. We examine a family of color centers in aluminum nitride, which emits close to 620 nm. We present a technique to rapidly map an ensemble of these single photon emitters, identifying all emitters, not just those with absorption dipole parallel to the laser polarization. We demonstrate a fast technique to determine their absorption polarization orientation in the c-plane, finding they are uniformly distributed in orientation, in contrast to many other emitters in crystalline materials.
Solid-state quantum light sources are being intensively investigated for applications in quantum technology. A key challenge is to extract light from host materials with high refractive index, where efficiency is limited by refraction and total internal reflection. Here we show that an index-matched solid immersion lens can, if placed sufficiently close to the semiconductor, extract light coupled through the evanescent field at the surface. Using both numerical simulations and experiments, we investigate how changing the thickness of the spacer between the semiconductor and lens impacts the collection efficiency (CE). Using automatic selection and measurement of 100 s of individually addressable colour centres in several aluminium nitride samples we demonstrate spacer-thickness dependent photon CE enhancement, with a mean enhancement factor of 4.2 and a highest measured photon detection rate of 743±4kcps.
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