Investigations of two-photon polymerization (TPP) with sub-100 nm in the structuring resolution are presented by using photosensitive sol-gel material. The high photosensitivity of this material allows for TPP using a large variety in laser pulse durations covering a range between sub-10 fs and ≈140 fs. In this study, the authors demonstrate TPP structuring to obtain sub-100 nm in resolution by different approaches, namely, by adding a cross-linker to the material and polymerization with sub-10 fs short pulses. Additionally, a simulation and model based characterization method for periodic sub-100 nm structures was implemented and applied in an experimental white light interference Fourier-Scatterometry setup.

Scatterometry is a well-established, fast and precise optical metrology method used for the characterization of sub-lambda periodic features. The Fourier scatterometry method, by analyzing the Fourier plane, makes it possible to collect the angle-resolved diffraction spectrum without any mechanical scanning. To improve the depth sensitivity of this method, we combine it with white light interferometry. We show the exemplary application of the method on a silicon line grating. To characterize the sub-lambda features of the grating structures, we apply a model-based reconstruction approach by comparing simulated and measured spectra. All simulations are based on the rigorous coupled-wave analysis method.

One common way to measure asphere and freeform surfaces is the interferometric Null test, where a computer generated hologram (CGH) is placed in the object path of the interferometer. If undetected phase errors are present in the CGH, the measurement will show systematic errors. Therefore the absolute phase of this element has to be known. This phase is often calculated using scalar diffraction theory. In this paper we discuss the limitations of this theory for the prediction of the absolute phase generated by different implementations of CGH. Furthermore, for regions where scalar approximation is no longer valid, rigorous simulations are performed to identify phase sensitive structure parameters and evaluate fabrication tolerances for typical gratings.

No abstract

We will discuss deflectometry from the physicist's and from the information theoretical point of view. The intrinsic features of deflectometry-incoherence, source encoding, high dynamical range, simplicity, and scalability-enable new sensors and unexpected applications. We will demonstrate that deflectometry is a novel imaging principle with a wide spectrum of new applications. The local slope of specularly reflecting surfaces can be measured for objects from µm-size to meter-size. With simple means, it is possible to find shallow (nm-) grooves or defects and to generate SEM-like images with high dynamical range. Microdeflectometry in transmission supplies extremely sensitive quantitative "phase contrast". Macroscopic deflectometry in transmission allows us to measure local refractive power with an accuracy better than 1 mD.