2017
DOI: 10.1109/ted.2017.2672640
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A New Design Approach of Dopingless Tunnel FET for Enhancement of Device Characteristics

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Cited by 121 publications
(55 citation statements)
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“…This is due to the characteristics of DF-TFET by using electrostatically doping. Compared to other dopingless TFETs [22,23,36,37], DF-TFET has obvious advantages on I ON . This is because of the improved tunneling rate by using line tunneling junction and SiGe material.…”
Section: Characteristics With Different Parameters and Analog/ Rf mentioning
confidence: 99%
“…This is due to the characteristics of DF-TFET by using electrostatically doping. Compared to other dopingless TFETs [22,23,36,37], DF-TFET has obvious advantages on I ON . This is because of the improved tunneling rate by using line tunneling junction and SiGe material.…”
Section: Characteristics With Different Parameters and Analog/ Rf mentioning
confidence: 99%
“…We have calibrated the simulation model using [48]. The same tunneling model has been used in [9], [10], [15], [17], [46], [49]. Further, it is important to mention that the purpose of this work is to demonstrate how DGTFETs can be modified and employed in logic function realizations, rather than examining the exact current and voltage values.…”
Section: B Simulation Modelmentioning
confidence: 99%
“…Therefore, a lower L gap is preferable in the proposed device. We have chosen L gap = 5 nm in this work, similar to other published works [16], [17]. Moreover, considering future applications, it is important to analyze the scalability of the proposed XOR implementations.…”
Section: Realizing Xor Function Using Tfet-xor Structurementioning
confidence: 99%
“…Wang at al. [136] The position deviation in the buried layer did not affect the device performance significantly. [135] The left gate segment was used to bend the band structure at the source-channel interface.…”
Section: Wwwadvelectronicmatdementioning
confidence: 99%