YFeO3 thin films are a recent addition to the family of multiferroic orthoferrites where YFe antisite defects and strain have been shown to introduce polar displacements while retaining magnetic properties. Complete control of the multiferroic properties, however, necessitates knowledge of the defects present and their potential role in modifying behavior. Here, the structure and chemistry of antiphase boundaries in Y‐rich multiferroic YFeO3 thin films are reported using aberration corrected scanning transmission electron microscopy combined with atomic resolution energy dispersive X‐ray spectroscopy. It is found that FeY antisites, which are not stable in the Y‐rich film bulk, periodically arrange along antiphase boundaries due to changes in the local structural environment. Using density functional theory, it is shown that the antiphase boundaries are polar and bi‐stable, where the presence of FeY antisites significantly decreases the switching barrier. These results highlight how planar defects, such as antiphase boundaries, can stabilize point defects that would otherwise not be expected to form within the structure.