Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniques

David, G.; Jäger, D.; Tempel, R.; Wolff, I.

doi:10.1007/bf00820157

Cited by 17 publications

(4 citation statements)

References 12 publications

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“…To access the lowestlevel conductors in LSIs with multi-level interconnections, a focused ion beam was used to make tungsten via-holes and pads especially for EO probing [52]. The other new feature is two-dimensional field mapping [53,54]. A photonic field-probing technique is less invasive than inductive probing and makes higher spatial resolutions possible.…”

Section: Ic Testing Systemmentioning

confidence: 99%

Photonic measurement technologies for high-speed electronics

Nagatsuma¹

2002

Meas. Sci. Technol.

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In this paper we review recent advances in photonic measurement technologies for high-speed electronics covering the frequency range from gigahertz to terahertz. In the first part we describe the basic technologies for photonic measurement, i.e. the generation and detection of high-frequency electrical signals. In the second part, we discuss recent practical applications, including high-speed integrated circuit probers, sampling oscilloscopes, network analysers, and imaging systems.

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Section: Ic Testing Systemmentioning

confidence: 99%

Photonic measurement technologies for high-speed electronics

Nagatsuma¹

2002

Meas. Sci. Technol.

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“…The work of G. David lithic microwave integrated circuits using the substrate of the circuits as the sensor element (internal electrooptic sampling). These measurements have revealed information for circuit characterization and failure detection [6]- [8] and could be used for verification of electromagnetic simulations. If the substrate does not exhibit the linear electrooptic effect and, moreover, when field patterns outside the substrate need to be known, external electrooptic sampling has to be used.…”

Section: Introductionmentioning

confidence: 99%

Electrooptic mapping of near-field distributions in integrated microwave circuits

Yang

David

Robertson³

et al. 1998

IEEE Trans. Microwave Theory Techn.

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A field mapping system based on external electrooptic sampling has been developed in order to determine the vectorial components of the electric near-field distribution within microwave integrated circuits. The capabilities of the setup are demonstrated by two-dimensional measurements of normal and tangential fields in a coplanar microwave distribution network at frequencies up to 15 GHz. Results obtained on a functioning power-distribution network, as well as on two nonfunctioning networks, show the ability of the technique to interrogate internal circuit operation and to isolate faults through investigation of the field distributions.

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“…Electrooptic measurements can be divided into two schemes, with the implementation depending on the device-under-test (DUT). For microwave structures fabricated on substrates that exhibit linear electrooptic effects, such as GaAs and InP, the internal electrooptic sampling method has proven to be quite effective [6]- [8]. If the substrate does not exhibit such an electrooptic effect and, moreover, when radiation field patterns are to be investigated, it is necessary to utilize external electrooptic sampling.…”

Section: Introductionmentioning

confidence: 99%

Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna

Yang

David

Yook

et al. 2000

IEEE Trans. Microwave Theory Techn.

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102

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A comprehensive electrooptic field-mapping technique is applied to the characterization of near-field radiation patterns above a microstrip patch antenna. The amplitude and phase maps of three orthogonal electric-field components, measured using electrooptic crystals above the patch, also have revealed the transition from the near field to the far field of the radiation pattern. In addition, experimental results have been compared with a finite-element method (FEM) simulation. The measurements show superior results to the FEM simulation, especially in terms of spatial resolution and data acquisition times. Furthermore, the scattering parameter 11 for the patch antenna has been calculated from the electrooptic measurement results of standing waves on the feeding line and compared with results from a conventional network analyzer.

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Analysis of microwave propagation effects using two-dimensional electrooptic field mapping techniques

Cited by 17 publications

References 12 publications

Photonic measurement technologies for high-speed electronics

Photonic measurement technologies for high-speed electronics

Electrooptic mapping of near-field distributions in integrated microwave circuits

Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna

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