Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements

Mertin, W.; Leyk, A.; Taenzler, F.; Novak, T.; David, G.; Jäger, D.; Kubalek, E.

doi:10.1016/0167-9317(94)90089-2

Microelectronic Engineering

1994

DOI: 10.1016/0167-9317(94)90089-2

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Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements

W. Mertin

A. Leyk

F. Taenzler

et al.

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Cited by 11 publications

(2 citation statements)

References 14 publications

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“…Electro-optic sampling techniques combine both convenient handling and temporal resolutions of less than 10 ps [ 2 ] , [3]. Two different electro-optic testing systems are known.…”

mentioning

confidence: 99%

Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

Hofmann

Pfleiderer

1996

J. Lightwave Technol.

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Abstruct-This paper deals with the indirect electro-optic sampling technique for the low-invasive detection of periodical voltage waveforms on lines in high-speed integrated circuits. The system introduced here is based on a passive mode-coupled Ti:Sapphire-Laser as light source for generating optical pulses in the subpicosecond regime. Therefore, we have to synchronize the resulting electric measurement signal and its external trigger onto the pulse repetition rate of this free running solid-state laser. The multi user function of the laser system forces us to transmit the pulses via a single-mode fiber into the measurement setup. For that purpose we developed a special optical arrangement to minimize the widening of the pulses in the time domain. The system's high-temporal resolution of nearly 10 ps in combination with its high-voltage sensitivity of about 800 p V / is demonstrated by measurements of an integrated microwave frequency divider.

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“…Electro-optic sampling techniques combine both convenient handling and temporal resolutions of less than 10 ps [ 2 ] , [3]. Two different electro-optic testing systems are known.…”

mentioning

confidence: 99%

Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

Hofmann

Pfleiderer

1996

J. Lightwave Technol.

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“…The MMIC used for the measurements is a test structure built up on a SI0 p m thick semi-insulating GaAs-chip of area [7] 2 x 3 mm2, which consists of a set of coplanar waveguides with a line width of 40 p m and spacing of 26 pm to the outer ground planes. The test structure itself is mounted on aglass carrier.…”

mentioning

confidence: 99%

Time resolved near-field scanning optical microscopy

Böhm¹,

Bangert²,

Mertin³

et al. 1994

J. Phys. D: Appl. Phys.

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The applicability of a near-field scanning optical microscope (NSOM) to measure ultrafast phenomena is experimentally demonstrated. For this application a commercial NSOM is combined with a picosecond laser sampling system. The ability of this time resolved NSOM to perform function and failure analysis of microwave devices is demonstrated. Measurements of high speed electric signals up to 7.5 GHz via the direct electro-optic sampling technique are performed.

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Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques

Mertin¹

1996

Opt Quant Electron

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Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements

Cited by 11 publications

References 14 publications

Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

Electro-optic sampling system for the testing of high-speed integrated circuits using a free running solid-state laser

Time resolved near-field scanning optical microscopy

Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques

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