Thick free‐standing GaN grown by hydride vapour phase epitaxy and epi‐ready substrates with c ‐, a ‐, m ‐plane surfaces are examined by variable‐temperature photoluminescence (PL), polarized PL and spatially resolved micro‐PL. Both as‐grown samples and polished substrates exhibit linewidth of the donor‐bound exciton emission below 0.7 meV at 2 K indicative of a high structural quality of the material. For as‐grown samples the relative intensity of green (2.4 eV) and red (1.8 eV) deep‐level‐defect emissions are found to decrease with increasing sample thickness. Based on plentiful two‐electron‐transition spectra measured in the samples the electronic fine structure of the donors and their bound‐exciton complexes was examined and discussed. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)