Efficient multisine testing of analog circuits

Nagi, N.; Chatterjee, Abhijit; Balivada, Ashok; Abraham, Jacob A.

doi:10.1109/icvd.1995.512115

Cited by 17 publications

(7 citation statements)

References 6 publications

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“…Although only single-tone signals are used, the test application time is expected to be rather short, since very few frequencies are usually required for fully testing analog filters [ 111. Besides this, as shown in [6], the use of multitone signals may lead to a loss on fault coverage when compared to the original set of single-tones.…”

Section: Test Paradigm and General Structurementioning

confidence: 96%

“…These structures were called built-in logic block obserservers (BILBOs) [l]. In the realm of analog circuits, some few works have recently presented isolated structures for either scanning analog signals [2,3], or generating test signals [4,5,6,7], or analysing circuit responses [4,8,9,10], but not all. In order to recreate the digital BILBO versatility in the analog domain, a novel multifiinctional BIST structure is proposed in this work for use in analog systems.…”

Section: Introductionmentioning

confidence: 99%

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ABILBO: Analog BuILt-in block observer

Lubaszewski¹,

Mir²,

Pulz³

Proceedings of International Conference on Computer Aided Design

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This paper presents a novel multifunctional test structure called Analog BulLt-in Block Observer (ABILBO). This structure is based on analog integrators and achieves analog scan, test frequency generation and test response compaction. A high fault coverage was obtained by using a discrete switched-capacitor ABILBO for testing a biquad filter. The ABILBO area overhead and performance penalty can be very low if functional and testing circuitry are shared. This is typically the case of high order filters based on a cascade of biquads

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Section: Test Paradigm and General Structurementioning

confidence: 96%

Section: Introductionmentioning

confidence: 99%

ABILBO: Analog BuILt-in block observer

Lubaszewski¹,

Mir²,

Pulz³

Proceedings of International Conference on Computer Aided Design

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“…In [7], the analog circuit was tested using sinusoidal steady state techniques. Faults were detected based on the difference in the steady state output amplitude Generation from that of the nominal fault free response.…”

Section: Digital Fault Detection and Testmentioning

confidence: 99%

“…The method in [8] formulates the DC test generation problem as a minimax optimization problem to take into consideration process variations in the detection of catastrophic faults in analog macro blocks. A technique that generates sinusoidal tests using sensitivity information obtained from discrete behavioral simulation has been presented in [7]. All the above techniques limit themselves to specific formulations and solution schemes which solve the test generation problem efficiently for either small circuits, or a restricted class of circuits.…”

Section: Introductionmentioning

confidence: 99%

A novel test generation approach for parametric faults in linear analog circuits

Zheng

Balivada

Abraham

Proceedings of 14th VLSI Test Symposium

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While analog test generation tools are still in their infancy, the corresponding tools in the digital domain have reached a fair degree of maturity and acceptance. Recognizing this fact, we propose a novel test generation method f o r linear analog circuits that employs well established digital test software t o generate time-domain tests for analog parametric faults. W e transform the analog circuit t o a n equivalent digital circuit, and target only those stuck-at faults in the digital circuit that could possibly capture parametric failures in the original analog circuit. Hence, the sequence of digital test vectors obtained f r o m any test generator represents a test waveform f o r the analog parametric faults. T h e technique is illustrated using examples that show this to be a simple, yet attractive alternative t o costlier simukationbased analog test generation approaches.

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“…Dedicated sine-wave oscillators have already been proposed for multifrequency testing (Khaled, 1995). To minimise the test effort, individual test signals can be combined to form a multi-tone test signal (Lu, 1994;Nagi, 1995). To save hardware, a method to reconvert a sigma-delta D/A converter into a precision analog sine-wave oscillator has been proposed in (Toner, 1993).…”

Section: Test Generation and Test Compactionmentioning

confidence: 99%

Test and Design-for-Test of Mixed-Signal Integrated Circuits

Lubaszewski

Huertas

Information Technology

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Although most electronic circuits are almost entirely digital, many include at least a small part that is essentially analog. This is due to the need to interface with the real physical world, that is analog in nature. As demanding market segments require ever more complex mixed-signal solutions, high quality tests become essential to meet circuit design specifications in terms of reliability, time-to-market, costs, etc. In order to lower costs associated to traditional specification-driven tests and, additionally, achieve acceptable fault coverages for analog and mixed-signal circuits, it is reasonable to expect that no other solution than a move towards defect-oriented design-for-test methods will be applicable in the near future. Therefore, testing tends to be dominated by embedded mechanisms to allow for accessibility to internal test points, to achieve on-chip test generation, on-chip test response evaluation, or even to make it possible the detection of errors concurrently to the circuit application. Within this context, an overview of existing test methods is given in this chapter, focusing on design-for-testability, built-in self-test and self-checking techniques suitable for the detection of realistic defects in analog and mixedsignal integrated circuits.Analog and mixed-signal test, fault modelling, fault simulation, test generation, defect-oriented test, design-for-test, design-for-testability, built-in self-test, self-checking circuits. Abstract:Keywords:

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Efficient multisine testing of analog circuits

Cited by 17 publications

References 6 publications

ABILBO: Analog BuILt-in block observer

ABILBO: Analog BuILt-in block observer

A novel test generation approach for parametric faults in linear analog circuits

Test and Design-for-Test of Mixed-Signal Integrated Circuits

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